FCQFN packaging part filled by underfill material and production process thereof
A manufacturing process and packaging technology, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc., can solve the problems of chip tin-silver bump melting, collapse, short circuit, etc., achieve short curing time, simplify process flow, The effect of low water absorption
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[0030] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0031] Such as Figure 14 As shown, an underfill-filled FCQFN package is mainly composed of a bare copper frame 1, a front copper groove 3, a blocking bump 4, an inner lead bump 5, an inner lead nickel palladium gold 6, an underfill 7, Chip 8, tin-silver bump 9, outer pin bump 11, plastic encapsulant 14 and tin ball 15 are composed. The bare copper frame 1 includes a blocking bump 4, an inner pin bump 5 and an outer pin bump 11, between the blocking bump 4 and the inner pin bump 5 is a front copper groove 3, and the inner pin bump is The inner pin nickel palladium gold 6 is plated on the block 5, and is bonded with the tin silver bump 9 on the chip 8 through the inner pin nickel palladium gold 6, and the underfill 7 surrounds the inner pin bump 5, the chip 8 tin-silver bumps 9 and the lower surface of the chip 8, the back of the inner lead bump 5 is an oute...
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