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A Method of Improving Scanning Linearity of Signal Analyzer

A signal analyzer, scanning linear technology, applied in spectrum analysis/Fourier analysis, automatic power control, electrical components, etc., can solve problems such as tuning voltage nonlinearity, control voltage oscillation amplitude becoming large, and reducing scanning speed

Active Publication Date: 2016-04-20
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the scanning speed of the local oscillator is high, the oscillation amplitude of the control voltage uc(t) becomes larger, which causes the obvious nonlinear phenomenon of the tuning voltage u(t)
At present, no effective way to solve this problem has been found, only by reducing the scanning speed as much as possible and ignoring the nonlinear influence of the control voltage uc(t)

Method used

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  • A Method of Improving Scanning Linearity of Signal Analyzer
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  • A Method of Improving Scanning Linearity of Signal Analyzer

Examples

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Effect test

Embodiment 1

[0028] The invention provides a method for improving the scanning linearity of a signal analyzer, such as Figure 4 As shown, the signal under test is input into the mixer 102 through the preselection filter 101 , and the intermediate frequency signal mixed with the sweeping local oscillator 103 passes through the resolution bandwidth filter 104 and enters the detector 105 to obtain the signal amplitude 107 . Such as Figure 4 As shown, assuming that the scan time is T, when performing a sweep measurement, take the measurement of the spectrum of frequency bands a to b as an example, here it is assumed that the local oscillator starts scanning at time T0, and the scanning driver 106 drives the local oscillator 103 to start scanning; when time T1 , the scanning driver 106 drives the local oscillator 103 to start linear scanning, and at the same time drives the detector 105 to start the detection operation, the frequency of the local oscillator is continuously tuned from a, and t...

Embodiment 2

[0040] On the basis of the above examples, if Figure 4-Figure 5 As shown, the present invention provides a kind of method for improving the scanning linearity of signal analyzer, which comprises the following steps:

[0041] Step A: recalculate the start frequency c of the local oscillator pre-scan according to the start and end frequency points and speed of the scan, c=a-[(b-a)K / T]; wherein the measured frequency band is the frequency spectrum of a to b frequency bands;

[0042] Step B: Set the initial frequency point c and scanning speed (b-a) / T of the local oscillator pre-scan;

[0043] Step C: set to control the scanning ramp driver to drive the local oscillator to start scanning at time T0; where time T0 is the time corresponding to pre-scanning point c;

[0044] Step D: Delay and wait until the time T1 arrives, the waiting time is the duration K of the oscillation of the control voltage uc(t);

[0045] Step E: During the time period of T2-T1, the data output by the dete...

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Abstract

The invention provides a method for improving scanning linearity of a signal analyzer. The method includes the following steps: (A) the pre-scanning starting frequency c of a local oscillator is calculated again according to the scanning speed, a starting frequency point and an ending frequency point, wherein c=a-<(b-a)K / T>, (B) the starting frequency c of the pre-scanning of the local oscillator and the scanning speed (b-a) / T are set, (C) at the time of T0, a scanning slope driver is controlled to drive the local oscillator to begin scanning, (D) waiting is delayed until the time of T1 comes, wherein the waiting time is the duration time K when voltage uc (t) is controlled to oscillate, and (E) in the time period of T2-T1, data output by a detector is a frequency spectrum of a frequency band a to a frequency band b of a tested frequency band. On the condition that a hardware circuit and the scanning local oscillator achievement scheme are not changed, by means of the pre-scanning of the local oscillator, a contradiction between improvement of the scanning speed and the scanning linearity of the local oscillator is eliminated, the precise characteristic of the closed-loop scanning of the local oscillator is guaranteed, and a foundation for the improvement of the scanning speed is laid.

Description

technical field [0001] The invention belongs to the technical field of local vibration driving of measuring instruments, and relates to a method for improving the linearity of local vibration scanning of a signal analyzer. Background technique [0002] At present, the synthetic local oscillator of most instruments is realized through a phase-locked technology with a feedback control system, that is, a phase-locked loop. A phase-locked loop is a negative feedback control system capable of phase tracking, which is mainly composed of phase detector (PD) 1, loop filter (LF) 2 and voltage-controlled oscillator (VCO) 3, as shown in the attached figure 1 shown. [0003] Input signal phase θ1(t) and feedback signal phase θ2(t) generate error signal ud(t) through phase detector 1. The error signal ud(t) is passed through the loop filter 2 to obtain the control voltage uc(t), and the control voltage uc(t) is applied to the voltage-controlled oscillator 3 to generate an oscillation f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03L7/08H03L7/099G01R23/16
Inventor 郭小文张超杜会文闫亚力
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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