Phase-locked loop resistant to single particle transient state

Abstract

The invention discloses a phase-locked loop resistant to a single particle transient state. The phase-locked loop comprises a phase frequency detector, a charge pump, a filter, a voltage-controlled oscillator and a frequency divider. A single particle suppression circuit is arranged between the charge pump and the filter and comprises a charge discharge branch, decay resistor, and a charge compensation branch. One end of the damping resistor is connected with an output end of the charge pump, and the other end of the damping resistor is connected with an input end of the voltage-controlled oscillator. When voltage of the output end of the charge pump is reduced and charging is needed, the filter charges the output end of the charge pump through the single particle suppression circuit. When the voltage of the output end of the charge pump rises and discharging is needed, the output end of the charge pump charges the filter through the single particle suppression circuit. Due to the fact that the single particle suppression circuit is arranged between the charge pump and the filter of the phase-locked loop, when receiving single particle bombardment, the output end of the charge pump discharges or be charged so as to reduce voltage disturbance caused on the input end of the voltage-controlled oscillator.

Description

technical field [0001] The invention belongs to the technical field of semiconductor integrated circuits, and relates to a single-event transient-resistant phase-locked loop. Background technique [0002] With the wide application of integrated circuits in space technology, more and more attention has been paid to their ability to resist single event transients, and the correctness of the output clock of the phase-locked loop as a clock generation module directly determines whether the electronic system can Therefore, for electronic systems working in radiation environments, the ability of phase-locked loops to resist single-event transients becomes a key technical indicator. [0003] At present, the industry has carried out extensive research on the anti-single event transient characteristics of phase-locked loops and achieved fruitful research results. For example, the article "A hardened-by-design technique for RF digital phase-locked loops" proposes a voltage-type charg...

AI Technical Summary

Problems solved by technology

This method is difficult to implement, because the single event transient pulse time is very short, tens of picoseconds to hundreds of picoseconds, and the gate delay of the locking detection circuit is close to the single event pulse time, so after the detection circuit judges that the single event occurs, The system is locked

Images