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A dynamic calibration source system with high precision, high linearity and high temperature stability

A dynamic calibration and linear calibration technology, applied in the direction of single semiconductor device testing, etc., can solve the problem that cannot meet the high precision, high linearity and high temperature stability of absolute power measurement calibration, and the conventional signal source cannot meet high precision, high linearity and high temperature stability. Temperature stability and other issues to achieve high linear output, ensure consistency, and high power accuracy

Inactive Publication Date: 2016-02-17
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

Therefore, although conventional signal sources can provide power output within a certain power range, they cannot meet the requirements of high precision, high linearity and high temperature stability required for absolute power measurement calibration
[0005] Therefore, in the measurement of radio frequency and microwave power based on diode detection, it is necessary to use a high-performance calibration source to achieve closed-loop measurement of absolute power. Conventional signal sources cannot meet the requirements of high precision, high linearity and high temperature stability. New Design method to meet calibration source requirements for high linearity, high accuracy and high temperature stability

Method used

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  • A dynamic calibration source system with high precision, high linearity and high temperature stability
  • A dynamic calibration source system with high precision, high linearity and high temperature stability
  • A dynamic calibration source system with high precision, high linearity and high temperature stability

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Embodiment Construction

[0015] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0016] The dynamic calibration source with high precision, high linearity and high temperature stability described in the present invention includes hardware circuit part and software compensation two parts, such as figure 1 As shown, the specific structure of the hardware circuit part is as follows:

[0017] High-stability voltage-controlled oscillator 1, which generates a 1GHz signal and sends it to the first-stage power amplifier 2 to achieve 14dB first-stage power amplification,

[0018] The model of the first-stage power amplifier 2 can be RF2045, and its output end is connected to the input end of the modulator 11 to realize the feedback control of the amplitude, and the modulator 11 includes two stages of HSMP-3892PIN diodes connected in series,

[0019] The output end of the modulator 11 is connected to the input end of the secondary power amplifier ...

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Abstract

The invention relates to a linear dynamic calibration source system, in particular to a high-accuracy high-linearity high-temperature-stability dynamic calibration source system. According to the high-accuracy high-linearity high-temperature-stability dynamic calibration source system, automatic gain control of a power level is achieved by using of a negative feedback loop. Power output in a large dynamic range is achieved by using of an electronic stored program control attenuator. In an automatic gain control loop circuit, high accuracy degree of power is achieved by using of a synchronous real-time compensating radio frequency detector, linear compensation and temperature compensation. High-linearity output of the power is achieved in the whole dynamic range, and consistency of the power output in the whole working temperature range is ensured.

Description

technical field [0001] The invention relates to a linear dynamic calibration source system, in particular to a dynamic calibration source system with high precision, high linearity and high temperature stability. Background technique [0002] In the RF and microwave power measurement based on diode detection, since there is no direct power substitution, for the same RF or microwave input power, the sensitivity difference between the probes or the sensitivity deviation caused by aging or temperature will cause the detection voltage to vary. There is a small deviation between them, and since there is no negative feedback to correct this small sensitivity deviation, the RF and microwave power measurements based on diode detection are open loop. [0003] In order to achieve closed-loop absolute power measurement, the power sensor must be calibrated with a high-performance calibration source, so that the power measurement can be traced to the manufacturer's standard, and then tra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 赵浩冷朋张小莉李强
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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