Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Nanoparticle measurement device and method

A nanoparticle and measuring device technology, applied in measuring devices, individual particle analysis, particle and sedimentation analysis, etc., to reduce production costs, ensure measurement accuracy and stability, and be easy to popularize and use.

Inactive Publication Date: 2013-01-16
NANJING LONGBOW INST OF SCI & TEACHING APP
View PDF8 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, its imaging method is still within the scope of the principle of geometric optics imaging, and its magnification ability is still only 1-2 thousand times, so it can still only observe micron-sized objects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nanoparticle measurement device and method
  • Nanoparticle measurement device and method
  • Nanoparticle measurement device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0028] figure 1 It is a schematic diagram of the structure of the nanoparticle measuring device of the present invention.

[0029] See figure 1 , the nanoparticle measuring device provided by the present invention includes a horizontally arranged sample pool 5, a CCD microscope 6 is arranged above the sample pool 5, and the CCD microscope 6 is connected to a computer 7, wherein, the sample pool 5 is provided with a The semiconductor laser 1, the semiconductor laser 1 and the sample pool 5 are arranged at a certain inclination angle so that the nanoparticles in the sample pool 5 generate scattered light spots. The bottom of the sample cell 5 is close to the semiconductor temperature control device, and the semiconductor temperature control device includes a hollow semiconductor refrigerator 4, and the cold end ceramic surface of the semiconductor refri...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
poweraaaaaaaaaa
wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a nanoparticle measurement device and method. The nanoparticle measurement device comprises a sample cell which is horizontally arranged, wherein a charge coupled device (CCD) microscope is arranged above the sample cell; the CCD microscope is connected with a computer; a semiconductor laser is arranged below the sample cell; and an inclined angle of 10 to 80 degrees is formed between the semiconductor laser and the sample cell. According to the nanoparticle measurement device and method, the semiconductor laser is arranged on the CCD microscope, and a certain inclined angle is formed between the semiconductor laser and the sample cell, so that the nanoparticles in the sample cell generate dynamic scattered light spots under irradiation of laser beams, the particle size and particle size distribution of the particles from dozens of nanometers to several nanometers are measured according to the Brownian motion equation proposed by Einstein; and therefore, the measurement precision and stability can be guaranteed, the production cost can be greatly reduced, and the nanoparticle measurement device is simple in structure and easy to popularize and use.

Description

technical field [0001] The invention relates to a measuring device and a measuring method thereof, in particular to a nanometer particle measuring device and a measuring method thereof. Background technique [0002] For the particle size measurement of nanoparticles, currently commonly used instruments include an electron microscope with a magnification capacity of hundreds of thousands of times and a nanoparticle sizer based on photon correlation spectroscopy (PCS for short). These two instruments mainly rely on imports, which are expensive and not easy to popularize. For example, the nanometer particle size analyzer uses the principle of dynamic light scattering and photon correlation spectroscopy technology to measure the particle size according to the Brownian motion speed of particles in the liquid. In order to ensure the authenticity and validity of the test results, the detector of the nanometer particle size analyzer needs to use a professional-grade high-performanc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/14
Inventor 彭志平彭旸
Owner NANJING LONGBOW INST OF SCI & TEACHING APP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com