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Ground test system aiming at large-aperture static interference imaging spectrometer

A technology of imaging spectrometer and static interference, which is applied in interferometric spectroscopy, spectrum investigation, etc., and can solve the problem that the functional performance of the ground test system cannot meet the requirements.

Inactive Publication Date: 2012-12-19
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0009] The LASIS hyperspectral imager has the characteristics of image-spectrum integration, high compression rate and high transmission rate, which make the current ground test system unable to meet the requirements in terms of function and performance.

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Embodiment Construction

[0029] Design principles of the present invention are as follows:

[0030] 1. The functions of each processing node are reasonably divided. The correlation between the functional modules contained in a single node should be strong, the communication interface and interaction between the nodes should be as few as possible, and the characteristics of loose coupling and high cohesion should be maintained, which is convenient for system reuse.

[0031] 2. Try to use commercial servers or general-purpose hardware + software to achieve performance and functions, so as to ensure system reusability, flexibility and lower post-cost.

[0032] 3. To ensure the storage speed and storage security of key data, the compressed data received by the system is the most critical data, because the compressed data from the source is the key basis for discovering instrument errors during the test.

[0033] 4. Use parallel computing technology to give full play to hardware performance and improve re...

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Abstract

The invention provides a ground test system aiming at a large-aperture static interference imaging spectrometer to fit the data output performance requirement and functional requirement of an LASIS (large-aperture static interference imaging spectrometer). The ground test system comprises a cache node, a preprocessing node, a decoding node and a display node, a plurality of network segments are planned, and each access of each node is attached to different network segments. The preprocessing node, the decoding node and the display node form a 10-gigabit local area network through an optical fiber exchange mechanism. The ground test system aiming at the large-aperture static interference imaging spectrometer can meet each performance and functional index of the LASIS. Variation of future test requirements can be met only by changing software, the decompressing node number can be decreased or increased according to actual needs, and decompressing software can satisfy JPEG (joint photographic experts group) 2000 decompressing operation with no need of modification and can serve as a decompressing node when being deployed on any server to enable system reusability.

Description

technical field [0001] The invention relates to satellite payload testing technology, in particular to a ground testing system for a large aperture static interference imaging spectrometer (LASIS). Background technique [0002] Large Aperture Static Interferometric Imaging Spectrometer (hereinafter referred to as LASIS Hyperspectral Imager) is a new type of instrument that can generate images and interference data at the same time, that is, each frame of data generated contains both "image and interference data" (hereinafter referred to as LASIS frame ). The instrument has the characteristics of high frame frequency, high spectral resolution, rich information, high data rate and large data volume. [0003] In order to adapt to the bandwidth of the satellite-ground transmission channel and improve the transmission efficiency, the LASIS frames generated by the LASIS hyperspectral imager need to be compressed. JPEG2000 is a lossy compression method with the best compression ra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 刘学斌李然陈小来胡炳樑王彩玲翟颉
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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