Four-dimensional electronic shadow imaging device

Abstract

The invention discloses a four-dimensional electronic shadow imaging device, comprising a Femtosecond laser light source, a laser frequency tripling device, a Femtosecond electron gun and an electronic attitude control system, an ultrahigh vacuum cavity, an electron multiplication system, an imaging acquisition system, a vacuum pump system, a sample operating system, an optical path regulation system, a shutter and a time synchronization system. The four-dimensional electronic shadow imaging device has the advantages of shingle-shot imaging, high time resolution, high sensitivity to electromagnetic field information, high signal-to-noise ratio and on the like, and can perform time and space four-dimensional shadow imaging for the plasma forming process, the photovoltaic process or other ultrafast processes in which the transient electromagnetic field participates observably. The four-dimensional electronic shadow imaging device can record the four-dimensional time-spatial revolution information of the transient electromagnetic field within a time scale from hundreds of picoseconds to nanosecond by an ultrahigh time resolution superior to one picosecond.

Description

technical field [0001] The invention relates to electronic shadow imaging, in particular to a time-resolved four-dimensional electronic shadow imaging device, which can provide ultra-high time resolution for studying the temporal and spatial evolution process with electromagnetic field transients such as transient plasma or photovoltaic effect. It has the advantages of single-shot imaging, high time resolution, sensitivity to electromagnetic field information, and high signal-to-noise ratio. technical background [0002] The development of femtosecond laser technology allows people to study ultrafast processes on a shorter time scale, usually using optical pumping and detection techniques. One beam of light pulses is used to excite a certain process, and the other beam of homologous laser pulses is used as a probe to detect the process excited by the pump light after a certain time delay and is recorded by the corresponding equipment for a certain type or Multiple types of ...

AI Technical Summary

Problems solved by technology

However, the number of electrons per detection pulse in single-shot experiments is relatively small, so the signal-to-noise ratio is not easy to guarantee

Increasing the number of electrons per detection pulse to increase the signal-to-noise ratio will result in a decrease in the time resolution of the system, due to the broadening of the electron pulse due to the increased Coulomb repulsion between electrons

Therefore, the technology still faces many challenges

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