Device for carrying out single particle overturn effect simulation on digital signal processor applied in space

Abstract

The invention discloses a device for carrying out single particle overturn effect simulation on a digital signal processor applied in space. The device comprises a simulation core module. The simulation core module concretely comprises an FPGA as a simulation controller and a PROM chip of the FPGA, and sockets used for plugging a measured chip FPGA and a PROM. The simulation controller is used for realizing readback and reconfiguration of the measured chip FPGA which is inserted in a socket through software programming, modifying configuration data of the measured chip FPGA according to a fault type needing to be injected in an operation process of the measured chip FPGA, dynamically reconfiguring the modified configuration data to the measured chip FPGA, and realizing the single particle overturn effect simulation of the measured chip FPGA. According to the device, an SRAM type FPGA is taken as a simulated measured chip and a controller, thus radiation simulation and fault injection simulation of single particle overturn are realized, functions are perfect, and the single particle overturn resistance capability of a semiconductor device can be effectively evaluated.

Description

technical field [0001] The invention relates to the technical field of digital signal processors, in particular to a device for simulating single-event flip effects on digital signal processors for space applications. Background technique [0002] At present, digital signal processors are susceptible to single event upset effects in space applications, and with the development of semiconductor devices, the influence of single event upsets continues to increase. In space applications, when a charged particle with sufficient transferred energy hits a chip, a single event upset can occur, which can have potentially serious consequences, including information loss and functional failure, leading to system failure. Therefore, the anti-single event upset ability of devices and their designs has become a research hotspot for space applications. [0003] For example, take Field Programmable Gate Array (FPGA), a semiconductor device, as an example. Since FPGA has the characteristics...

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Problems solved by technology

These two methods need to build a perfect platform including the controller and the chip under test for the simulation experiment of the single event reversal effect, but there is no perfect device and platform for simulating the single event reversal effect in the existing technical solutions, so that it cannot Effectively evaluate the anti-single event upset ability of semiconductor devices

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