High-sensitivity single pulse single beam measuring method for material optical nonlinearity

A high-sensitivity, non-linear technology, applied in the field of optical non-linear measurement of materials, can solve the problems that cannot meet the measurement requirements, and achieve the effects of convenient measurement methods, accurate test results, and comprehensive test parameters

Inactive Publication Date: 2011-09-14
SUZHOU UNIV
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  • Abstract
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Problems solved by technology

The measurement sensitivity of this method is the same as that of the general measur

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  • High-sensitivity single pulse single beam measuring method for material optical nonlinearity
  • High-sensitivity single pulse single beam measuring method for material optical nonlinearity
  • High-sensitivity single pulse single beam measuring method for material optical nonlinearity

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Embodiment 1

[0023] Embodiment one: see attached figure 1 As shown, a high-sensitivity single-pulse method for measuring nonlinear parameters of materials is composed of an optical beam splitter, a convex lens, a baffle, and a detector; the pulse laser is focused on the sample to be tested.

[0024] attached figure 1 is a diagram of the experimental setup for a high-sensitivity single-pulse nonlinear method for measuring materials. The experimental setup can be divided into three parts: beam expander system, measurement system and reference system. The beam expander system is composed of a convex lens 2 and a convex lens 3; the measurement system consists of a small hole 4, a convex lens 7, a sample to be measured 8, a second beam splitter 9, a convex lens 10, a second detector 11, a circular baffle 12, and a convex lens 13 and a third detector 14. Wherein, the sample 8 to be tested is placed on the focal plane of the convex lens 7 . The pulsed laser light emitted from the laser is fir...

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Abstract

The invention discloses a high-sensitivity single pulse single beam measuring method for material optical nonlinearity. A round baffle is arranged in an optical path of a probe light after passing through a sample, and under the function of the single pulse, nonlinear absorption and nonlinear refraction coefficient of the material are determined by measuring a nonlinear transmittance of an open pore and a far field baffle. A measuring system working according to the method provided by the invention is simple in optical path, extremely high in measurement sensitivity and simple in data process, uses the single pulse to measure the sample which is not needed to move, and can simultaneously measure the size of the nonlinear absorption and the nonlinear refraction, so that measurement cost is greatly reduced.

Description

technical field [0001] The invention relates to a method for measuring optical nonlinearity of materials, and belongs to the field of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, four-wave mixing, third harmonic nonlinear interferometry, ellipsometry, phase object Z-scan, etc. Among them, th...

Claims

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Application Information

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IPC IPC(8): G01N21/59G01N21/41
Inventor 杨俊义宋瑛林李中国税敏金肖
Owner SUZHOU UNIV
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