Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Non-contact temperature measurement device for induction cooker

A technology of non-contact temperature measurement and induction cooker, which is applied in measuring devices, optical radiation measurement, radiation pyrometry, etc., to improve accuracy and avoid time lag in temperature measurement

Inactive Publication Date: 2011-07-13
CHINA JILIANG UNIV
View PDF4 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to provide a non-contact temperature measurement device for an electromagnetic oven, which can solve the problem of accurate temperature measurement of an electromagnetic oven by utilizing the characteristics of non-contact temperature measurement of an infrared thermal imager

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Non-contact temperature measurement device for induction cooker
  • Non-contact temperature measurement device for induction cooker
  • Non-contact temperature measurement device for induction cooker

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be further described below with reference to the drawings:

[0019] in figure 1 , figure 2 As shown, the present invention includes a thermal imager support panel 6 installed in the support 8 that can move up and down along the support 8. In the center of the thermal imager support panel 6 is installed an infrared thermal imager 7 with the lens facing upwards. The guide rails 3 are fixed on the sides, and the extension ends of the two guide rails 3 are supported by angle irons 10. The induction cooker support panel 5 is installed on the two guide rails 3, and the induction cooker support panel 5 with the induction cooker 4 can slide along the guide rail 3 in the X direction. The pot support panel 2 with a through hole in the middle is fixed on the bracket 8. The pot support panel 2 is located above the induction cooker 4, the pot 1 is placed in the through hole of the pot support panel 2, and the bottom center of the pot 1 is in the infrared The...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a non-contact temperature measurement device for an induction cooker. A thermal imager supporting panel capable of moving up and down along a bracket is arranged in the bracket. An infrared thermal imager is arranged in the center of the thermal imager supporting panel. Two guide rails are fixed on the two sides of the upper part of the bracket respectively, and the extended ends of the two guide rails are supported by angle iron respectively. An induction cooker supporting panel is arranged on the two guide rails, and can slide in an X direction along the guide rails. A cookware supporting panel is fixed on the bracket, and is positioned above the induction cooker, and the center of the cookware supporting panel is provided with a through hole. Cookware is arranged in the through hole of the cookware supporting panel. The center of the bottom surface of the cookware is collinear with the center of a lens of the infrared thermal imager. The infrared thermal imager is connected with a computer. The non-contact temperature measurement device for the induction cooker is not required to damage the integrity of the induction cooker, can measure the average temperature of the bottom of the whole cookware in real time to more intuitively reflect the temperature condition of the cookware compared with conventional contact point temperature measurement, avoids temperature measurement time lag caused by a ceramic panel and improves the temperature measurement accuracy.

Description

Technical field [0001] The invention relates to an electromagnetic oven temperature measurement device, in particular to a non-contact temperature measurement device for an electromagnetic oven. Background technique [0002] The induction cooker has become one of the necessary kitchen utensils in modern kitchens, and the current induction cooker not only has the heating function, but also includes various intelligent functions such as: automatic water boiling, automatic cooking, automatic heat preservation, etc. The realization of these functions requires Only a basic condition can be realized, that is, the accurate temperature measurement and temperature control of the induction cooker, so the temperature measurement of the induction cooker is also an important direction of scientific research. In order to achieve functions such as automatic heating power control, the existing induction cooker products all measure the temperature of the pot indirectly by placing a thermistor on ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
Inventor 陈乐王一孙坚郑坚璐易子豐
Owner CHINA JILIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com