Active component array and detection method

Abstract

The invention provides an active component array and a detection method. The active component array comprises a plurality of scanning lines, a plurality of data lines, a plurality of pixel structures, a first detection line, a second detection line, a third detection line and a fourth detection line. Each pixel structure is electrically connected with one scanning line and one data line, the first detection line is electrically connected with an odd number of scanning lines, the second detection line is electrically connected with the (4n+1)th scanning line, wherein n is 0 or a positive integer, the third detection line is electrically connected with an even number of scanning lines, and the fourth detection line is electrically connected with the (4n+2)th scanning line. The active component array and the detection method provided by the invention can be used for effectively detecting the defects in the line, thereby being beneficial to the improvement of the yield of the active component array.

Description

technical field [0001] The present invention relates to an active element array and a detection method, and in particular to an active element array and a detection method capable of effectively detecting short-circuit defects. Background technique [0002] Generally speaking, a liquid crystal display panel includes an active device array substrate, a facing substrate, and a liquid crystal layer sandwiched between the two substrates. After the active element array substrate is manufactured, the active element array must be tested to ensure that the active liquid crystal display panel can display normally. [0003] At present, the detection of the active device array mostly focuses on whether the pixel structure can display normally. If there are defects in other circuits of the active device array, such as short circuit or open circuit, they are usually not further detected until the liquid crystal display or liquid crystal display panel is assembled. [0004] In other wor...

AI Technical Summary

Problems solved by technology

At this time, short-circuit defects between lines are more likely to occur, and the scrap rate and cost waste of LCD panels may also increase accordingly.

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