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Method and device for testing chip

A chip and the technology to be tested are applied in the computer field, which can solve the problems of increased test cost and achieve the effect of reducing test cost and simplifying the operation process

Inactive Publication Date: 2007-09-19
VIMICRO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The present invention provides a method and device for testing chips, which are used to solve the problem in the prior art that the user increases the testing cost due to the use of an automatic tester when mass production testing the chip.

Method used

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  • Method and device for testing chip
  • Method and device for testing chip

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Embodiment Construction

[0037] In order to solve the problem that in the prior art, the user increases the test cost due to the use of automatic testers when performing mass production tests on chips, and cannot complete the test task on time due to the limitation of the number and machine time of the automatic testers. In this embodiment, the test device first compiles the corresponding test program according to the test task through the mutually independent server, control circuit board and execution circuit board, and then reads the test vector from the compiled test program to test the chip, and according to The test response returned by the chip determines whether the state of the chip is normal.

[0038] The scan chain test pattern (Scan Pattern) is taken as an example below and described in detail with reference to the accompanying drawings.

[0039] In this embodiment, the test plan consists of two parts, one part is the design of the test program, and the other part is the design of the test...

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Abstract

The invention discloses a device for testing the chip, including the mutually stand-alone server, simulator, control circuit board and running circuit board, in which: the server is used for creating the test program according to the test tasks, and output to the simulator; the simulator is connected with the server for simulation processing of the test program, and creating the simulation document with test data and sending to the control circuit board; the control circuit board is connected with the simulator for reading the relevant test vectors from the simulation document, and sending this test vector to the running circuit board, and decide whether the relevant chip is in good conditions or not according to the test response feedback from the running circuit board; the running circuit board is connected with the control circuit board for testing the relevant chip according to the test vector from the control circuit board, and sending the test response to the control circuit board. Thus, during the batch production testing of chip, the automatic tester with expensive rent may be not rented, thereby greatly reduce the test cost. The invention still discloses a test method for chip.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a method and device for testing a chip. Background technique [0002] After the chip is mass-produced, it needs to be tested for manufacturing defects with a test pattern. The so-called test pattern is the test signal and the expected response loaded into the chip integrated circuit during the test. The test pattern mainly includes a test pattern (ROM BIST Pattern) for testing the read-only memory in the chip, a test pattern (RAM BIST Pattern) for testing the random access memory in the chip, and a scan chain test pattern (Scan Pattern). [0003] At present, mass production testing of chips needs to be carried out on an automatic tester (Auto Test Equipment, ATE). ATE is an instrument for testing integrated circuits. It applies test vectors (test vectors) to integrated circuits according to preset test signals. At the same time, compare the observed response with the expected ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/3177G01R31/317
Inventor 崔云飞吴大畏
Owner VIMICRO CORP
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