Spin accumulation device and magnetic sensor applied with spin current confined layer
a magnetic sensor and spin current technology, applied in the field of spin accumulation devices, can solve the problems of insufficient output amplitude, inability to achieve an increased output, and the tunneling junction for achieving an increased output does not provide a function as an external magnetic field sensor, etc., to achieve high sensitivity, reduce electric noise, and high resolution
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example 1
[0028]FIG. 1 shows a sectional side view of a spin accumulation device according to a first example of the present invention, and FIG. 2 shows a plan view of the device. The spin accumulation device is structured so that a nonmagnetic conductive material 101 and a first magnetic conductive material 103 are in contact with an insulating barrier layer 102 formed on the nonmagnetic conductive material 101 and so that a second magnetic conductive material 105 is in contact with the nonmagnetic conductive material 101 at another location. Magnetization of the first magnetic conductive material 103, which functions as a spin injection source, is magnetically fixed by an anti-ferromagnetic material 104. A voltage induced by the spin accumulation effect in the nonmagnetic conductive material 101 is detected between the second magnetic conductive material 105 and the above nonmagnetic conductive material 101. The voltage-detection second magnetic conductive material 105 was formed so that it...
example 2
[0039]FIG. 4 shows a sectional side view of a spin accumulation device according to a second example of the present invention, and FIG. 5 shows a plan view of the device. This spin accumulation device is provided with a spin current confined layer 405 between a voltage-detection magnetic conductive material 406 and a nonmagnetic conductive material 401 (see FIG. 6). The nonmagnetic conductive material 401, an insulating barrier layer 402, a magnetic conductive material 403, and an anti-ferromagnetic material 404 used in the present example were the same as those used in Example 1.
[0040]As shown in FIG. 5, the junction area of the spin current confined layer 405 and the nonmagnetic conductive material 401 is defined by A2′=wN×wF2. Note that the junction area A2′ was obtained by measuring the wire width wN of the nonmagnetic wire and the wire width wF2 of the magnetic wire with an atomic force microscopy. Reference numerals 501 and 502 denote a DC current source and a voltage detector...
example 3
[0046]FIG. 8 shows a sectional side view of a spin accumulation device according to a third example of the present invention. Based on the present spin accumulation device, a magnetic conductive material 802 that injects a current 806 and a nonmagnetic conductive material 801 are electrically in direct contact with each other. The nonmagnetic conductive material 801, magnetic conductive materials 802 and 805, and an anti-ferromagnetic material 803 used in the present example were the same as those used in Example 1, and a spin current confined layer 804 used in the present example was the same as that used in Example 2. Since the nonmagnetic conductive material 801 and the magnetic conductive material 802 are electrically in direct contact with each other, a low-noise spin accumulation device can be obtained. Additionally, since the spin current confined layer 804 is used, higher output can be achieved as in Example 2.
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