Automatic reference voltage trimming technique
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[0027]FIG. 1 shows one embodiment of an integrated circuit (IC) 150 in which a controller / logic block (LBC) 154 is configured to perform a test algorithm to control trimming of a reference value generating circuit (RGC) 152 in order to obtain a specific reference value 156. Reference value 156 may be used by functional circuit (FC) 160, which is also comprised on IC 150. LBC 154 may be configured to receive one or more test inputs 162 and one or more control signals from FC 160. LBC 154 may also be configured to communicate with a tester apparatus 158, which may initiate execution of the test algorithm by LBC 154 and may poll LBC 154 to ascertain whether trimming has been completed. Alternately, LBC 154 may be designed to provide a signal to tester apparatus 158 a specified time period after testing had been initiated, indicating that the trimming is complete. In one embodiment, RGC 152 is bandgap reference and reference value 156 is a reference voltage, while FC 160 is an ADC opera...
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