Sample rack for X-ray diffraction phase analysis and analysis method thereof

Abstract

The invention relates to qualitative and quantitative analysis for X-ray diffraction mineral. Wherein, the X-ray diffraction phase analysis sample bracket comprises a silicon single-crystal piece in the following base frame, a base frame, and a dust-carry film stuck on said single-piece; the single-crystal piece is single diffraction peak, and is prepared by cutting into pieces along the crystal face 0-12Deg and grinding and polishing. This invention can eliminate the effect to measurement accuracy from device, time and parameter, simplifies operation, and cuts time to improve efficiency.

Description

technical field [0001] The invention belongs to the use of particle radiation to test or analyze materials, in particular to qualitative and quantitative analysis of X-ray diffraction minerals (phases). Background technique [0002] With the development of testing technology, X-ray diffraction testing technology is widely used in the fields of metallurgy, mining, chemical industry and environmental protection to test and analyze the samples under inspection. In the prior art, the qualitative and quantitative analysis of X-ray diffraction minerals uses a silicon single chip without diffraction peaks as a sample carrier for micro-sample phase analysis. The defect is that it cannot be used as a reference for quantitative phase analysis, and the measurement cycle is long and the error is large. . For example, free SiO in respirable dust in environmental protection 2 Quantitative phase analysis uses a low-power X-ray diffraction analysis method. First, the dust-laden film is as...

AI Technical Summary

Problems solved by technology

In the prior art, the qualitative and quantitative analysis of X-ray diffraction minerals uses a silicon single chip without diffraction peaks as a sample carrier for micro-sample phase analysis. The defect is that it cannot be used as a reference for quantitative phase analysis, and the measurement cycle is long and the error is large.

For example, free SiO in respirable dust in environmental protection 2 Quantitative phase analysis uses a low-power X-ray diffraction analysis method. First, the dust-laden film is ashed, then filtered, and collected on the sample rack for measurement. Using the relationship between the diffraction degree of the sample crystal plane and the quality of the standard sample, the trace sample phase is carried out. Analysis, long analysis cycle, cumbersome operation, large error

In the United States, the Ag film is used as the base plate for micro-sample phase analysis, which is costly and difficult to promote.

[0003] For samples with large mass, the copper sample holder is used for quantitative phase analysis by absorption-diffraction method. Copper has multiple diffraction peaks, which interfere with the selection of quantitative peaks, and the diffraction intensity is low, the measurement range is narrow, and the quantitative accuracy is low.

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