Design method of plane light delay device and its structure
A design method and delayer technology, applied in the field of optical communication, can solve problems such as impracticality and transmission rate limitation, and achieve the effects of wide spectrum range, good delay, and broad application prospects
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Embodiment 1
[0018] The preset operating wavelength of embodiment 1 is 1.55 μm, where polycrystalline Si and amorphous SiO 2 The refractive indices are 3.5 and 1.45, respectively. The thicknesses are 0.111 μm and 0.267 μm respectively, the left and right ends of the structure are taken as 2 and 3 normal structural periods respectively, N is taken as 9, and the defect layer of amorphous SiO 2 The thickness is taken as 0.534 μm. The transmission spectrum of the film system calculated by the transmission matrix method is as follows figure 2 As shown, the first differential of the dispersion relation is as image 3 shown. It can be seen from the figure that the retarder of this structure can reduce the speed of light to 1×10 7 m / s, the applicable spectrum range Δω is 8×10 12 Hertz can meet the basic requirements of high-speed optical communication.
Embodiment 2
[0019] Example 2 is similar to Example 1, for the working wavelength of 1.3 μm, select polycrystalline Si and amorphous SiO 2 The thicknesses are 0.093 μm and 0.224 μm respectively, the left and right ends of the structure are taken as 2 and 3 normal structure periods respectively, N is taken as 11, and the defect layer of amorphous SiO 2 The thickness is taken as 0.448 μm. The calculation and simulation results show that the optical retarder has good retardation and wide spectrum range under this parameter condition.
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