Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Microwave frequency conversion assembly testing device and testing method

A technology of component testing and microwave frequency conversion, applied in receiver monitoring, transmitter monitoring, etc., can solve the problem of low test efficiency and achieve high test efficiency

Active Publication Date: 2022-07-22
CHINA ELECTRONIC TECH GRP CORP NO 38 RES INST
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the deficiencies of the prior art, the present invention provides a microwave frequency conversion component testing device and method, which solves the technical problem of low testing efficiency of the existing method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microwave frequency conversion assembly testing device and testing method
  • Microwave frequency conversion assembly testing device and testing method
  • Microwave frequency conversion assembly testing device and testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0055] In order to make the purposes, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention are described clearly and completely. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the implementations. example. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0056] The embodiment of the present application solves the technical problem of low test efficiency of the existing method by providing a microwave frequency conversion component testing device and method, and realizes the rapid completion of automatic testing of all indicators.

[0057] The technical solutions in the embodiments of the present application are to solve the above-mentioned technical problem...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a microwave frequency conversion assembly testing device and testing method, and relates to the technical field of microwave frequency conversion assembly testing. In the invention, a test adaptation system is used for executing receiving and transmitting channel switching and dual-channel switching when a dual-channel transmit-receive frequency conversion assembly is tested according to a special test program, testing instrument equipment switching in an instrument system when different indexes are tested, and providing a serial port control signal for the dual-channel transmit-receive frequency conversion assembly. According to the invention, hardware equipment such as integration of a multifunctional instrument test system, a data communication network and the like is adopted, so that the problems of large quantity of test instrument equipment, manual switching test of a multi-channel transceiving frequency conversion assembly, repeated operation, poor consistency of multiple test results in a production process and the like in a dual-channel transceiving frequency conversion assembly test are solved. The method and the device are high in testing efficiency, meet the requirements of mass production testing, and can quickly and accurately complete full-index system automatic testing.

Description

technical field [0001] The invention relates to the technical field of microwave frequency conversion component testing, in particular to a microwave frequency conversion component testing device and a testing method. Background technique [0002] The digital array module DAM is a radar front-end module integrated with multiple transceiver channels. It adopts multi-channel integration technology, digital transceiver technology, and optoelectronic modulation and demodulation technology to complete the functions of digital array radar radio frequency transceiver and data preprocessing, and realize high-speed transmission of large-capacity data. The multi-channel all-digital transceiver module. As an important part of DAM, the integrated frequency conversion component is used to realize the functions of frequency conversion, signal amplification and filtering between the radio frequency signal and the intermediate frequency signal of the DAM system. How to accurately and quick...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/10H04B17/20
CPCH04B17/101H04B17/20Y02D30/70
Inventor 李伟杨露钱昕
Owner CHINA ELECTRONIC TECH GRP CORP NO 38 RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com