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Defect detection method and device, electronic device and computer readable storage medium

A defect detection and defect technology, which is applied in the field of defect detection, can solve problems such as errors in defect determination, and achieve the effect of avoiding errors and noise

Pending Publication Date: 2022-07-19
FU TAI HUA IND SHENZHEN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, because there will be more noise in the test sample, the determination of the defect has errors

Method used

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  • Defect detection method and device, electronic device and computer readable storage medium
  • Defect detection method and device, electronic device and computer readable storage medium
  • Defect detection method and device, electronic device and computer readable storage medium

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Embodiment 3

[0061] The third embodiment obtains the training weights obtained when training the autoencoder and the autoregressive network by using normal training samples, and loads the training weights into the autoencoder and the autoregressive network so as to load the training weights The self-encoder encodes the test sample to obtain the test encoding feature, and the test encoding feature is input to the autoregressive network loaded with the training weight to output the test result, and the test result includes the test sample One of the presence of defects and the absence of defects in the test sample. Therefore, in this case, the essence of the test sample can be directly used to determine whether the test sample is defective, instead of directly using the test sample to determine whether the test sample is defective, and there is no need to compare with the test sample, thus avoiding the test sample. The noise in the defect can avoid errors in the determination of defects.

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Embodiment 4

[0075] Embodiment 4 Obtaining normal training samples, inputting the normal training samples into the autoencoder to encode the normal training samples to obtain training coding features, and inputting the training coding features to the autoregressive network for performing the coding. training to generate the training weights of the autoencoder and the autoregressive network, obtain the training weights obtained when training the autoencoder and the autoregressive network with normal training samples, and load the training weights into the autoencoder and the autoregressive network. In the autoregressive network, the test coding feature is obtained by encoding the test sample by the autoencoder loaded with the training weight, and the test coding feature is input into the autoregressive network loaded with the training weight to output a test result, the test result includes one of defects in the test sample and absence of defects in the test sample. Therefore, in this case,...

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Abstract

The invention discloses a defect detection method. The defect detection method comprises the following steps: obtaining training weights obtained when a normal training sample is used for training an auto-encoder and an auto-regression network; loading the training weight into the auto-encoder and the auto-regression network so as to encode a test sample through the auto-encoder loaded with the training weight to obtain a test encoding feature; and inputting the test coding feature into the autoregression network loaded with the training weight to output a test result, wherein the test result comprises one of the condition that the test sample has defects and the condition that the test sample does not have defects. The invention further provides a defect detection device, an electronic device and a computer readable storage medium. Defect determination errors can be avoided.

Description

technical field [0001] The present invention relates to the technical field of defect detection, and in particular, to a defect detection method and device, an electronic device and a computer-readable storage medium. Background technique [0002] The current defect detection method is to input a test sample into a trained autoencoder to obtain a reconstructed image corresponding to the test sample, and determine the reconstructed image according to the difference between the reconstructed image and the test sample. Test the sample for defects. However, because there are more noises in the test sample, the determination of the defect is erroneous. SUMMARY OF THE INVENTION [0003] In view of this, it is necessary to provide a defect detection method and device, an electronic device and a computer-readable storage medium, which can avoid errors in the determination of defects. [0004] A first aspect of the present application provides a defect detection method, the defec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06V10/774G06V10/82G06K9/62G06N3/04
CPCG06T7/0002G06N3/04G06N3/045G06F18/214G06V10/82G06V2201/06G06T7/0004G06T2207/20081G06T2207/20084G06N3/088G06V10/7796G06V10/95G06T2207/30168G06V10/774
Inventor 蔡东佐郭锦斌林子甄简士超
Owner FU TAI HUA IND SHENZHEN
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