Simulation method and simulation system of integrated circuit

A simulation method and integrated circuit technology, applied in electrical digital data processing, instruments, calculations, etc., can solve problems such as excessive file size, affecting the simulation speed and simulation accuracy of integrated circuits, and achieve the effect of improving simulation accuracy

Pending Publication Date: 2022-07-12
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the time-consuming extraction of parasitic capacitance parameters and the large file size of the parasitic parameter netlist will affect the simulation speed and simulation accuracy of the integrated circuit simulation

Method used

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  • Simulation method and simulation system of integrated circuit
  • Simulation method and simulation system of integrated circuit
  • Simulation method and simulation system of integrated circuit

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Embodiment Construction

[0032] It can be known from the background art that the simulation accuracy for simulating an integrated circuit needs to be improved.

[0033] The present disclosure provides a simulation method for an integrated circuit and a simulation system thereof. In the simulation method, parasitic parameter information of at least part of the semiconductor device in the unit list is imported on the basis of the initial netlist, which is beneficial to the operation of the real simulation integrated circuit. The parasitic effect between various semiconductor devices is beneficial to improve the simulation accuracy of the simulation of the integrated circuit.

[0034] The embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can appreciate that, in the various embodiments of the present disclosure, many technical details are provided for the reader to better understand the embodimen...

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Abstract

The embodiment of the invention relates to the technical field of semiconductors, and provides a simulation method of an integrated circuit and a simulation system thereof, the simulation method is applied to a server, and the method comprises the following steps: receiving a unit list provided by a client; receiving an initial netlist provided by the client, wherein the initial netlist comprises a plurality of semiconductor devices and a connection relationship between the semiconductor devices in the unit list; importing parasitic parameter information of at least part of semiconductor devices in the unit list into the initial netlist to generate a result netlist; and simulating the integrated circuit based on the result netlist. The embodiment of the invention is at least beneficial to improving the simulation precision of simulating the integrated circuit.

Description

technical field [0001] The embodiments of the present disclosure relate to, but are not limited to, an integrated circuit simulation method and a simulation system thereof. Background technique [0002] With the continuous advancement of technology, the performance impact of parasitic effects such as parasitic capacitance on integrated circuits cannot be ignored, especially for deep sub-micron integrated circuit design. Specifically, an integrated circuit contains multiple electronic components, and each component may generate parasitic capacitance, which will affect the actual circuit. Post-simulation testing can be used to test whether the circuit containing parasitic capacitance meets the design requirements. At present, after the parasitic capacitance parameters are extracted, the extracted parasitic capacitance parameters are listed one by one in the code segment to form a flat parasitic parameter netlist for the integrated circuit to simulate. [0003] However, the ti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/327
CPCG06F30/327
Inventor 赵康邱安平白黎陈川江
Owner CHANGXIN MEMORY TECH INC
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