Three-stage control system and method for wide-range bidirectional DCDC electronic load

Abstract

The invention relates to a three-stage control system and method for a wide-range bidirectional DCDC electronic load, and is used for solving the technical problems of high test cost, low test precision and difficulty in debugging existing in a method for combining a plurality of power supply loads in a traditional power supply test. The system comprises an input stage circuit, an intermediate stage circuit unit, an output stage circuit, a first control system for controlling the input stage circuit, a second control system for controlling the intermediate stage circuit unit and a third control system for controlling the output stage circuit, the output end of the third control system is connected with the first control system. According to the method, an input-stage circuit adopts a voltage outer loop control and current inner loop control mode, an intermediate-stage circuit adopts a fixed-frequency and fixed-duty-ratio open-loop control mode, and an output-stage circuit adopts a constant-current, constant-voltage, constant-resistance and constant-power outer loop control and inductive current inner loop control mode; the input-stage circuit and the output-stage circuit are synchronously controlled, energy of the intermediate-stage circuit is automatically distributed, and bidirectional control is realized.

Description

technical field [0001] The invention relates to the field of power supply testing, in particular to a three-level control system and method for a wide-range bidirectional DCDC electronic load. Background technique [0002] In some special industries, the test of the power supply requires the input and output of the electronic load to be able to adapt to a wide range of input requirements. Usually, it is necessary to use a combination of multiple power supply load modules. Although these methods can meet the basic test requirements, they are expensive and expensive to test. Low precision and difficult to debug. SUMMARY OF THE INVENTION [0003] The purpose of the present invention is to solve the technical problems of high test cost, low test accuracy and difficult debugging in the traditional method of using multiple power load combinations for power supply testing, and to provide a three-level control system and method for a wide-range bidirectional DCDC electronic load ...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the technical problems of high test cost, low test accuracy and difficult debugging in the traditional power supply test method of combining multiple power supply loads, and provide a three-level control system and method for a wide range of bidirectional DCDC electronic loads

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