Ultralow temperature preparation method of TMO film and TMO-TFT
A TMO-TFT, ultra-low temperature technology, applied in the field of ions, can solve the problems that limit the application of traditional solution methods, and achieve excellent electrical properties, improved compatibility, and good semiconductor properties.
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Embodiment 1
[0071] The substrate in the present embodiment selects commercially purchased single-sided polishing p ++ Thermally oxidized silicon wafers, wherein the thickness of thermally oxidized silicon is 100nm; hydrated indium nitrate was purchased from Sigma-Aldrich; the ultrapure water was self-made 18.2MΩ deionized water. Concrete preparation process is as follows:
[0072] Step 1: Preparation of In 2 o 3 Precursor:
[0073] Firstly, hydrated indium nitrate was dissolved in deionized water with a concentration of 0.2 mol / L, and then magnetically stirred at room temperature for 6 hours to obtain colorless and transparent In 2 o 3 Precursor solution, stand for later use;
[0074] Step 2: Substrate cleaning:
[0075] First prepare the p ++ Thermally oxidized silicon wafers were ultrasonically cleaned in deionized water, acetone, isopropanol, and deionized water for 10 min each, and then dried with nitrogen;
[0076] Step 3: Substrate Surface Activation:
[0077] The cleaned p...
Embodiment 2
[0102] Material selection and steps 1-3 are with embodiment 1;
[0103] Step 4: Prepare In 2 o 3 film:
[0104] First, use a 0.22 μL water-based filter head to filter In 2 o 3 Precursor solution to remove insoluble impurities in the solution; then filter the filtered In in an environment with a relative humidity of less than 25% 2 o 3 The precursor solution is added dropwise to the p ++ Thermally oxidized silicon wafers were spin-coated at a speed of 4500 rpm for 30 seconds to obtain In 2 o 3 Wet film; finally In 2 o 3 The wet film was placed on a heating plate and pre-annealed at 45 °C for 10 min in the atmosphere to obtain pre-annealed In 2 o 3 film;
[0105] Step 5: N 2 Plasma treatment pre-annealed In 2 o 3 film:
[0106] Such as Figure 4 As shown, the pre-annealed In obtained in step 4 2 o 3 The film was placed in a plasma treatment device for N 2 Plasma treatment for 30 minutes, wherein the control plasma treatment temperature is 45°C, the plasma tre...
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