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Differential linear error test system and test method for high-precision digital-to-analog converter

A technology of digital-to-analog converter and differential linearity, which is applied in the directions of analog/digital conversion calibration/test, analog/digital conversion, code conversion, etc. It can solve the problems of poor test stability and accuracy, limited board test range, etc. Achieve the effect of high test efficiency, enhanced stability and applicability, and reduced test accuracy

Pending Publication Date: 2022-01-25
SG MICRO
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The differential linearity error of the existing test digital-to-analog converter is mainly to test the output voltage through the high-precision board of the tester, but it will be limited by the test range of the board, and the test stability and accuracy are poor

Method used

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  • Differential linear error test system and test method for high-precision digital-to-analog converter
  • Differential linear error test system and test method for high-precision digital-to-analog converter

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Embodiment Construction

[0026] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be implemented in different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention.

[0028] Hereinafter, the present invention will be described in detail with reference t...

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Abstract

The invention discloses a differential linear error test system and method for a high-precision digital-to-analog converter, and the system comprises a programmable power module which is used for providing at least one group of test codes for a to-be-tested digital-to-analog converter, wherein the to-be-tested digital-to-analog converter outputs a corresponding analog voltage based on the at least one group of test codes; at least one operational amplifier, wherein each operational amplifier is used for carrying out difference value operation on analog voltages output by the two output ends of the digital-to-analog converter to be tested and carrying out amplification output on a difference value; and a test source which is used for measuring the output voltage of each operational amplifier and obtaining a high-precision differential linear error based on a measured value, wherein each group of test codes comprises two adjacent test codes, and the two analog voltages received by each operational amplifier correspond to one group of test codes. According to the invention, high-precision differential linear error measurement can be realized by using a test source with a low precision requirement, the test stability is high, and the applicability is strong.

Description

technical field [0001] The invention relates to the technical field of DAC testing of digital-to-analog converters, in particular to a differential linearity error testing system and testing method of high-precision digital-to-analog converters. Background technique [0002] As the name suggests, a digital-to-analog converter (DAC) is an integrated chip that converts digital signals into analog signals. As a bridge between the analog and digital worlds, it is particularly important in modern electronic products. It is widely used in multimedia, data Collection, mobile communication and other fields. With the continuous progress of economic development and science and technology, it has also greatly promoted the further improvement of IC technology. As an important part of electronic products, digital-to-analog converters have also been greatly developed and applied. Therefore, digital-to-analog converters It is particularly important to test its own parameters. [0003] Th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/1071
Inventor 邴春秋
Owner SG MICRO
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