Integrated circuit test equipment
A technology for testing equipment and integrated circuits, which is used in electronic circuit testing, components of electrical measuring instruments, and measuring electricity, etc., and can solve the problem of difficult test heads, damage to test points of integrated circuit boards, and deviation of inclination angles of integrated circuit board testing equipment. and other problems to achieve the effect of preventing damage and avoiding damage
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Embodiment 1
[0022] as attached figure 1 to attach Figure 4 Shown:
[0023] The present invention is a kind of integrated circuit test equipment, and its structure comprises console 1, box door 2, guard board 3, test main frame 4, described console 1 front face is installed with cabinet door 2, and console 1 is welded with Shield 3, the test host 4 is located in the middle of the upper end face of the console 1, and the test host 4 includes an electric control console 41, a clamp mechanism 42, a lowering mechanism 43, a push plate 44, a support plate 45, and a cylinder 46. The bottom of the electric console 41 is fixedly installed in the middle of the upper end surface of the console 1, and the clamp mechanism 42 is embedded and installed on the upper end surface of the electric console 41, and the lower end of the lowering mechanism 43 is fixedly installed on the upper end surface of the electric console 41. The middle end of the lowering mechanism 43 is fixed inside the outer end of t...
Embodiment 2
[0029] as attached Figure 5 to attach Figure 7 Shown:
[0030] Wherein, the descending mechanism 43 includes a test mechanism 431, a corrugated plate 432, a data line 433, and a buffer mechanism 434. The corrugated plate 432 is fixedly installed on the top of the test mechanism 431, and the upper end of the corrugated plate 432 is fixed to the bottom of the push plate 44. The data line 433 is electrically connected to the inside of the test mechanism 431, the buffer mechanism 434 is located at the outer end of the test mechanism 431, the bottom of the buffer mechanism 434 is fixed to the outer side of the upper end surface of the electric console 41, and the folded plate 432 is made of rubber The material has a certain degree of resilience, which is beneficial to play a buffering role when the pushing plate 44 exerts a downward force on the testing mechanism 431 .
[0031] Wherein, the test mechanism 431 includes a detection head 31a, a conduction plate 31b, a pipe sleeve 31...
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