Enhanced sample imaging using structured illumination microscopy
A technology for microscope objective lenses and samples, applied in microscopes, optical devices, optical radiation measurement, etc., can solve the problems that SIM systems cannot be compatible with confocal microscopes, and confocal microscopes cannot be irradiated once, etc., to improve spatial resolution and reduce costs. , the effect of improving image quality
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
example 1
[0056] simulation study
[0057]Imaging of real samples with "ground-truth images" was simulated using confocal SIM according to the modified imaging method described in this paper and compared with conventional CLSM. Simulation results were obtained using the light propagation library available online as "PROPER". This suite of programs for simulating the propagation of light through optical systems using Fourier transform algorithms (Fresnel, angular spectrum) has been thoroughly validated as a physical optics propagation tool and is commonly used by astronomers for telescopes. performance modeling. This library is used to simulate, in particular, the confocal and confocal SIM point spread functions of a 532nm laser passing through a 100x, 0.7NA objective lens and focusing through a 75mm focal length lens into a 25μm confocal pinhole. image 3 The simulated point spread function of this confocal SIM example is plotted for three different angles of the beam (0, π / 3, 2π / 3)...
example 2
[0060] Experiment demonstration
[0061] according to figure 2 With the configuration shown, a prototype microscope was built for performing confocal SIM. The dichroic mirror provides the ability to observe the laser spot on the sample using the microscope camera. This camera was used to acquire spot images from the SLM generated by the SIM pattern to demonstrate that the same focused fringe pattern as in the physical optics propagation simulation study described in Example 1 was generated. This is based on a side-by-side comparison with simulation results, taking into account the circular border around the images acquired in this experimental demonstration to help indicate approximate alignment with the confocal pinhole. In the simulation studies, the simulated SIM laser patterns have taken into account the application of confocal masks, which is why the outer shapes of these patterns are circular, as in image 3 shown.
[0062] Use Pelcotec TM CDMS (Critical Dimensio...
PUM
Property | Measurement | Unit |
---|---|---|
diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com