Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Antiwear Cu-base material with high electric conductivity

A wear-resistant material and high conductivity technology, applied in the field of copper-based alloys, can solve problems such as difficult processing, poor stress corrosion resistance, and poor conductivity

Inactive Publication Date: 2003-12-31
ZHEJIANG UNIV
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, although C63800 alloy and C68800 alloy have higher strength, the former has poor electrical conductivity, while the latter has poor stress corrosion resistance, high cold work hardening performance, and difficult processing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0008] The material composition contains (by weight) 1.6% Ti, 0.7% B, 0.4% Sn, 0.02% Ce, and remaining Cu. According to the material composition, industrial pure copper, boron-copper master alloy, industrial pure tin, industrial pure titanium and cerium-rich mixed rare earth are smelted in an intermediate frequency furnace and the temperature of the alloy melt is controlled at 1250-1350 ℃, and cast into rods (or plates) Blank. Ingot milling, homogenized annealing, hot extrusion and cold drawing to make bars and wires; slabs can be hot rolled and cold rolled to make thin strips.

[0009] Table 1 shows the mechanical, electrical and thermal properties of the material of the present invention at room temperature (20°C). Table 1 Tensile Strength Yield Strength Elongation Elastic Modulus Hardness Electrical Conductivity Thermal Conductivity

[0010] W / cm·s·℃σ b (MPa) σ 0.2 (MPa) δ(%) E(GPa) HV %IACS610-650 480-510 6-10 116-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
elastic limitaaaaaaaaaa
elastic limitaaaaaaaaaa
Login to View More

Abstract

A copper-base alloy material contains Ti (0.4-2.9 wt.%), B (0.2-1.3 wt.%), Sn (0.1-0.9 wt.%), Ce (0.01-0.06 wt.%) and Cu (the balance). Its advantages are excellent antiwear nature, and electric and thermal conductivities, higher tension strength and elastic extreme, proper toughness, lower expandability, easy machining and welding, and sealing performance with resin.

Description

technical field [0001] The invention belongs to copper base alloy. Background technique [0002] At present, chromium bronze, tin bronze and Cu-Fe-P series (such as C19400) are widely used in electric processing electrodes and welding electrodes, instruments and meters, conductive contact reeds, connectors and other elastic contact elements in electronic communication devices, and integrated circuit lead frames. alloy) and other alloys. Although chromium bronze with low chromium content (such as QCr0.5) has high electrical conductivity, it has low tensile strength and hardness, and poor wear resistance, while chromium bronze with high chromium content (Cr≥0.8 %) The smelting process is complicated, and composition segregation is easy to occur; tin bronze (containing Sn: 5-8%) has poor processability, long production cycle, low electrical conductivity, low thermal stability, and the maximum working temperature is less than 100°C; C19400 The wear...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C22C9/00
Inventor 涂江平杨友志张孝彬刘芙
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com