Optimal blanking method of chip test automatic production line

An automated production line and chip testing technology, applied in automated testing systems, electronic circuit testing, electrical measurement, etc., can solve problems such as occupying machine space, increasing machine size, and increasing design costs, so as to improve timeliness and design The effect of reducing cost and improving the timeliness of blanking

Active Publication Date: 2021-07-30
珠海达明科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the first nozzle picks up the chip whose coordinates are (8, 0), nozzle 2 ~ nozzle 8 move at the same time a distance of 8× the distance between the tray columns. At this time, nozzle 2 ~ nozzle 8 move outside the tray, occupying A certain amount of machine space is required, resulting in a certain increase in the size of the entire machine, the machine is not compact enough, and the design cost is increased

Method used

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  • Optimal blanking method of chip test automatic production line
  • Optimal blanking method of chip test automatic production line
  • Optimal blanking method of chip test automatic production line

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Embodiment Construction

[0018] Embodiments of the present invention are as follows.

[0019] Such as figure 1 As shown, in the method of the present invention, the blanking equipment of the automatic chip test production line is set as a tray, the tray is provided with vertically and horizontally distributed chip positioning grooves, and the coordinate system is established with the vertically and horizontally distributed pallets of the chip positioning grooves, and the horizontal setting of the pallet is The X-axis is set as the Y-axis in the longitudinal direction of the tray, and the chip positioning slots provided on the tray have m rows×n columns, wherein m and n are both natural numbers greater than 1, and m>n, each chip positioning slot is set Set it as a coordinate point, set the chip positioning groove in the first row and the first column as the origin of the coordinate system, the coordinate value is (X, Y) = (0,0), the coordinates of the chip positioning groove in the first row and the se...

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Abstract

The invention provides an optimal blanking method of a chip test automatic production line. The method can save space, reduce cost and effectively improve efficiency. According to the method, the time efficiency is improved by optimizing a sucking and placing path of a chip, so that the production efficiency is improved; and the transverse moving distance of an X axis of a variable-pitch suction nozzle module is reduced, so that the space is saved, a machine table is more compact, the cost is reduced, and more competitive products and services are provided for customers. The optimal blanking method of the chip test automatic production line can be applied to the field of equipment control.

Description

technical field [0001] The invention relates to the field of equipment control, in particular to an optimal blanking method of an automatic chip testing production line. Background technique [0002] With the continuous development and progress of modern manufacturing technology, China has spent a lot of manpower and material resources in the manufacturing industry, especially the electronics manufacturing industry, which only earns product processing fees. According to the financial reports released by traditional manufacturing companies such as listed companies Foxconn, Pegatron, and BYD Data: The net profit of the company's operations is only between 1% and 3%, and if you are not careful, you will enter a loss situation. How to improve timeliness and reduce costs, provide customers with more competitive products and services, and create more profits, so that both parties can establish a more stable supply-demand relationship and achieve a win-win situation has always been...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B65G47/91B65G43/08G01R31/28B65G65/32
CPCB65G47/918B65G43/08G01R31/2834G01R31/2893B65G65/32
Inventor 符式鹏徐海东刘怡君张文超
Owner 珠海达明科技有限公司
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