Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Protection method based on VFTO waveform characterization parameter influence weight

A parameter and characterization technology, which is applied in the protection based on the influence weight of VFTO waveform characterization parameters, and the field of fast transient overvoltage suppression. problems, achieve effective and reliable protection, obvious pertinence and rationality, and improve the effect of protection

Pending Publication Date: 2021-07-27
XI AN JIAOTONG UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the VFTO waveform characteristics vary with the change of GIS equipment parameters, the current research on the influence factors of waveform representation parameters is limited to the influence mechanism and influence law of a single variable, lacking the analysis of the influence mechanism and weight of multiple variables, and the protection measures adopted The VFTO method is not effective and pertinent, which greatly increases the cost of protection, but at the same time cannot guarantee the insulation resistance level of the equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Protection method based on VFTO waveform characterization parameter influence weight
  • Protection method based on VFTO waveform characterization parameter influence weight
  • Protection method based on VFTO waveform characterization parameter influence weight

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings and examples.

[0022] refer to figure 1 , The present invention is a method of protecting the weight based on VFTO waveform gauge, including:

[0023] Step 1, establish an equivalent circuit model of all one-time side device under the VFTO of the gas insulated substation (GIS).

[0024] The equivalent circuit model of the present invention can be established by EMTP-RV electromagnetic transimation simulation software, including busbars, transformers, sleeves, high voltage cables, isolation switch, circuit breakers, voltage transformers, metal oxide arresters, and arcs, wherein the bus is used. The frequency response non-destructive transmission line model in the FDQ module in the EMTP-RV, the transformer uses a model that delivers overvoltage, and the casing uses a non-destructive transmission line and the overhead end pair capacitance, and the high voltag...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A protection method based on VFTO waveform characterization parameter influence weights comprises the steps of establishing equivalent circuit models of all primary side equipment of a GIS under VFTO, and recording all factors possibly influencing VFTO waveform characterization parameters; setting a plurality of levels according to the value range for different influence factors, and establishing a corresponding orthogonal table by using an orthogonal test method; traversing all simulation setting conditions on the orthogonal table, and performing simulation calculation on the VFTO to obtain a simulation result; based on the simulation result, performing data processing on the orthogonal table according to a range method and a variance method to obtain an influence weight of each influence factor on the VFTO waveform characterization parameter; and aiming at the influence weight proportion of the VFTO waveform characterization parameter, adopting a corresponding protection means or device for suppression. According to the method, the influence weights of various influence factors on the VFTO waveform characterization parameters can be effectively and accurately analyzed, the protection cost is greatly saved, and the protection reliability and effectiveness are improved.

Description

Technical field [0001] The present invention belongs to the field of power electronics, relates to a rapid transient overvoltage (VFTO) inhibition, and more particularly to a method of impact weight based on VFTO waveform gauge. Background technique [0002] Since the rising edge is from 1 to 5 ns, the magnitude is 2.5pu, the steepness is large, the main oscillation frequency is 1 ~ 10MHz and the continuous pulse number, and the number of continuous pulse is severely damaged by the insulation tolerance. . Since the experimental study of VFTO conducts difficulty, VFTO is simulated by electromagnetic transimation simulation software to study the simplest, direct and effective way to study VFTO. The model construction of the GIS device under VFTO depends on the design structure of the device and its own electromagnetic characteristics. When the VFTO waveform characteristics of the secondary device is studied, the VFTO is harassed and transiently raised for the secondary side shieldi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/367
CPCG06F30/367Y02E60/00
Inventor 李超邱云鹏沈林王致远康超余飞宏郭洁
Owner XI AN JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com