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Hybrid waveguide, preparation method of optical microscope probe and optical microscope probe

An optical microscope and microscope technology, which is used in the preparation of hybrid waveguides and optical microscope probes, and in the field of optical microscope probes, can solve the problems of low optical transmittance, complicated optical paths used by probes, and limited application of near-field probes. , to achieve the effect of a simple preparation method

Inactive Publication Date: 2021-02-19
UNIV OF SCI & TECH OF CHINA
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, the optical transmittance of this probe is extremely low, and its efficiency is about 10 when the aperture is about 100nm. -4 ; and when the pore size is about 50nm, its efficiency is only about 10 -5 , which greatly limits the application of near-field probes under weak signals
[0003] In recent years, various other novel scanning near-field microscope probes have been reported, such as optical antenna probes, far-field excitation plasmon probes with grating structures, pyramid probes, etc., but these probes either The processing technology and technology have extremely high requirements, or the optical path of the probe is relatively complicated, and there are certain defects of its own.

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  • Hybrid waveguide, preparation method of optical microscope probe and optical microscope probe
  • Hybrid waveguide, preparation method of optical microscope probe and optical microscope probe
  • Hybrid waveguide, preparation method of optical microscope probe and optical microscope probe

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Embodiment Construction

[0026] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concepts of the present disclosure.

[0027] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present disclosure. The terms "comprising", "comprising", etc. used herein indicate the presence of stated features, ...

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Abstract

The disclosure provides an optical microscope probe, which comprises an optical fiber taper, a silver nanowire, a quartz tuning fork and a circuit board; the optical fiber taper and the silver nanowire are coupled to form a hybrid waveguide, the quartz tuning fork is welded and fixed on the circuit board, and the hybrid waveguide is fixed on the quartz tuning fork and the circuit board through ultraviolet glue. The overall coupling efficiency of the optical microscope probe exceeds 20% through experiments, scanning imaging is carried out on different samples in an objective lens excitation probe collection mode and a probe excitation objective lens collection mode, and experimental results prove that the optical microscope probe is high in efficiency and feasible for super-resolution optical imaging. The disclosure also provides a hybrid waveguide and a preparation method of the optical microscope probe.

Description

technical field [0001] The present disclosure relates to the field of surface plasmons and near-field optics, in particular to a preparation method of a hybrid waveguide, an optical microscope probe, and an optical microscope probe. Background technique [0002] Most of the commercial scanning near-field microscope probes in the prior art adopt the aperture type, that is, a metal film is coated on the surface of the tapered optical fiber, and then a small aperture is left on the tip end face, generally with a diameter of about 50-150 nm. Light outlet for collection and emission. When the probe moves to the near-field range of the scanning sample, the probe can interact with the evanescent waves on the surface of the material structure, thereby breaking through the optical diffraction limit. However, the optical transmittance of this probe is extremely low, and its efficiency is about 10 when the aperture is about 100nm. -4 ; and when the pore size is about 50nm, its effici...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/22G01Q70/16
CPCG01Q60/22G01Q70/16
Inventor 吴赟琨任希锋李明郭光灿
Owner UNIV OF SCI & TECH OF CHINA
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