Component status detection device and method based on low-frequency noise
A state detection device, a technology of low-frequency noise, applied in the direction of noise coefficient or signal-to-noise ratio measurement, etc., to achieve the effects of low measurement conditions, simple circuit structure, high economic and social benefits
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[0061] In order to better understand the technical solutions of the present invention, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
[0062] The present invention uses the low-frequency noise of electronic components to detect the components, so the degradation characterization parameters based on low-frequency noise are determined, mainly including:
[0063] 1) Excessive g-r noise: it reflects defects in the internal area of components, and appears as abnormal fluctuations that deviate from the equilibrium position on the time domain waveform of the noise signal;
[0064] 2) The effective value of the power spectrum at the ...
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