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Component status detection device and method based on low-frequency noise

A state detection device, a technology of low-frequency noise, applied in the direction of noise coefficient or signal-to-noise ratio measurement, etc., to achieve the effects of low measurement conditions, simple circuit structure, high economic and social benefits

Active Publication Date: 2021-12-24
BEIHANG UNIV
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Problems solved by technology

[0005] In order to overcome the defects of the prior art, the object of the present invention is to realize the detection of the state of the components and parts through the low-frequency noise of the electronic components and parts, which can overcome the defects of the traditional method, and realize accurate detection of the defects and expected life of the components and parts during the detection process of the components and parts. Efficient judgment

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  • Component status detection device and method based on low-frequency noise
  • Component status detection device and method based on low-frequency noise
  • Component status detection device and method based on low-frequency noise

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Embodiment Construction

[0061] In order to better understand the technical solutions of the present invention, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0062] The present invention uses the low-frequency noise of electronic components to detect the components, so the degradation characterization parameters based on low-frequency noise are determined, mainly including:

[0063] 1) Excessive g-r noise: it reflects defects in the internal area of ​​components, and appears as abnormal fluctuations that deviate from the equilibrium position on the time domain waveform of the noise signal;

[0064] 2) The effective value of the power spectrum at the ...

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Abstract

The present invention provides a low-frequency noise-based component state detection device and method, which includes a low-frequency noise acquisition circuit, an embedded system, and a host computer connected in sequence; wherein the low-frequency noise acquisition circuit is composed of a high-low frequency combined filter circuit and a parallel low-noise operation Amplifier composition; embedded system includes analog signal sampling circuit, analog-digital conversion module, internal memory, preliminary analysis waveform drawing module and oscilloscope; upper computer includes upper computer memory, fault screening module, prediction module, frequency domain analysis module, calculation module and visual interface modules. The low-frequency noise acquisition circuit collects low-frequency noise and sends it to the embedded system; the low-frequency noise is converted into a low-frequency noise digital signal by the embedded system; the host computer receives the low-frequency noise digital signal for storage and processing, and obtains the status of components. The application realizes the detection of low-frequency noise signals, and uses the low-frequency noise signals to screen and predict component failures.

Description

technical field [0001] The invention relates to the field of electronic components, in particular to a low-frequency noise-based component state detection device and method. Background technique [0002] In the production and life of modern society, electronic products play an indispensable role, but due to the sudden failure of the components that make up electronic products, electronic products will also fail, and this sudden failure often brings life and death property loss. The component screening process in the production process of electronic products can effectively eliminate components with factory defects, reduce the sudden failure of electronic products in the subsequent use process, and improve the reliability of electronic products. [0003] Traditional component screening methods include manual observation and detection, parameter testing and so on. Manual observation and detection mainly rely on the human body's senses to judge the state of components, and it...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/26
CPCG01R29/26
Inventor 陈云霞郑舒文卢震旦余昌博刁泉贺仵若玙张丛然
Owner BEIHANG UNIV
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