Component state detection device and method based on low-frequency noise

Abstract

The invention provides a component state detection device and method based on low-frequency noise. The component state detection device comprises a low-frequency noise acquisition circuit, an embeddedsystem and an upper computer which are connected in sequence, wherein the low-frequency noise acquisition circuit consists of a high-frequency and low-frequency combined filter circuit and a parallellow-noise operational amplifier; the embedded system comprises an analog signal sampling circuit, an analog-to-digital conversion module, an internal memory, a preliminary analysis waveform drawing module and an oscilloscope. The upper computer comprises an upper computer memory, a fault screening module, a prediction module, a frequency domain analysis module, a calculation module and a visual interface module. The low-frequency noise acquisition circuit acquires low-frequency noise and sends the low-frequency noise to the embedded system; the embedded system converts the low-frequency noiseinto a low-frequency noise digital signal; and the upper computer receives, stores and processes the low-frequency noise digital signal to obtain the state of the component. According to the invention, the detection of the low-frequency noise signal is realized, and the low-frequency noise signal is utilized to screen and predict component faults.

Description

technical field [0001] The invention relates to the field of electronic components, in particular to a low-frequency noise-based component state detection device and method. Background technique [0002] In the production and life of modern society, electronic products play an indispensable role, but due to the sudden failure of the components that make up electronic products, electronic products will also fail, and this sudden failure often brings life and death property loss. The component screening process in the production process of electronic products can effectively eliminate components with factory defects, reduce the sudden failure of electronic products in the subsequent use process, and improve the reliability of electronic products. [0003] Traditional component screening methods include manual observation and detection, parameter testing and so on. Manual observation and detection mainly rely on the human body's senses to judge the state of components, and it...

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Problems solved by technology

[0005] In order to overcome the defects of the prior art, the object of the present invention is to realize the detection of the state of the components and parts through the low-frequency noise of the electronic components and parts, which can overcome the defects of the traditional method, and realize accurate detection of the defects and expected life of the components and parts during the detection process of the components and parts. Efficient judgment

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