System-level integrated circuit DC voltage drop parallel analysis method and system

Abstract

The invention discloses a system-level integrated circuit DC voltage drop parallel analysis method and system, and the method comprises the steps of carrying out the parallel analysis through employing a plurality of coarse particles according to the random dynamic distribution and applying a first distribution principle; enabling each coarse particle to independently and synchronously divide thesystem-level integrated circuit into a plurality of same subsystems by taking a layer as a unit, performing the same mesh generation on the whole system-level integrated circuit and establishing the same finite element sparse matrix; when each subsystem is processed, enabling each coarse particle to process different subsystems, combining other subsystems except the subsystem into a to-be-processed system, eliminating internal nodes of the to-be-processed system by repeatedly utilizing star triangle transformation, and obtaining and solving a finite element sparse matrix only containing a field domain of the subsystem. The invention greatly simplifies the solving process, improves the solving speed on the basis of guaranteeing the solving precision, and achieves the quick and accurate analysis of the DC voltage drop of a system-level super-large-scale integrated circuit.

Description

technical field [0001] The invention relates to the technical field of system-level integrated circuit analysis, in particular to a parallel analysis method and system for system-level integrated circuit DC voltage drop. Background technique [0002] The DC voltage drop analysis of system-level VLSI is an important task in the back-end verification of integrated circuits. In the design process of the current system-level VLSI, the core power supply voltage of the devices in the integrated circuit continues to decrease, and the tolerance of the allowable voltage is getting smaller and smaller, but the operating current and wiring density of the integrated circuit are getting larger and larger. As a result, the DC voltage drop problem has become increasingly prominent. If the DC voltage drop problem is not considered in the design process of the system-level VLSI, it is likely that the noise margin of the system will decrease due to the DC voltage drop problem, and a small di...

AI Technical Summary

Problems solved by technology

For system-level VLSI with multi-scale structure, if high-quality meshing is directly performed on the area where the entire system-level VLSI is located, the number of grid nodes generated will reach tens of millions or even hundreds of millions. It is difficult to directly solve the tens of millions or even hundreds of millions of finite element sparse matrices formed by the grid. Even if it can be solved, it will require huge memory and CPU time. For the design of system-level VLSI Said that the time cost is too high, so how to provide a high-precision and speed-block solution method to quickly and accurately analyze the DC voltage drop of the system-level VLSI has become an urgent technical problem to be solved

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