Chip synchronous testing device and chip synchronous testing method

Abstract

The invention provides a chip synchronous testing device and a chip synchronous testing method, and belongs to the field of chip testing. The chip synchronous testing device comprises communication testing circuits, a high-density connector circuit and a USB selection circuit; the communication testing circuits comprise a plurality of communication line ports and are used for synchronous testing of a plurality of chips; the high-density connector circuit is used for connecting the communication testing circuits and to-be-tested chip equipment; the USB selection circuit is used for switching ona corresponding chip testing interface based on the communication interface type of a to-be-tested chip; the USB selection circuit comprises a 1:3 protocol chip which is used for distinguishing chiptesting paths of different communication interface types. Through the arrangement of chip testing circuits of various interface types, diversity of chip testing types is realized; each type of communication test circuit comprises a plurality of port expansion chips, and a test path is expanded into a plurality of testing paths, so that the synchronous test of t plurality of chips is realized. Theproblem that a plurality of chips cannot be synchronously tested in the prior art is solved.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a chip synchronous testing device and a chip synchronous testing method. Background technique [0002] At present, the chip industry is developing rapidly, and the chip output is also increasing day by day. In the chip production process, chip testing is a very important step. Most of the existing technologies carry out corresponding test equipment design according to the type of chips produced by themselves. On the one hand, the chips of various manufacturers The test results are uneven, and on the other hand, it also makes the test equipment unable to be popularized. Existing test equipment is mainly realized by fixtures, which need to be customized according to the test chip, and chip test equipment often can only test chips one by one, and cannot realize simultaneous testing of multiple chips, resulting in the existing chip test efficiency cannot meet the chip production requireme...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the embodiments of the present invention is to provide a chip synchronization test device to at least solve the above-mentioned problem that multiple chips cannot be tested synchronously

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