Microwave electric field phase measuring method

A measurement method and microwave technology, applied in electrostatic field measurement and other directions, to achieve the effect of improving measurement sensitivity, clear principle and simple structure

Pending Publication Date: 2020-12-18
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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Problems solved by technology

[0003] In recent years, with the development of quantum technology, the world has begun to use quantum technology to realize the research on microwave electric field phase measurement methods. Among them, the microwave electric field phase measurement scheme based on the quantum EIT-AT effect is limited by the width of the transparent window of the detection light. The width of the detection light window is affected by factors such as laser line width, photon shot noise, and Rydberg atom decoherence, so it is difficult to achieve precise measurement of the extremely weak microwave electric field

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Embodiment Construction

[0024] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention.

[0025] Such as figure 1 As shown, the present invention provides a kind of measuring method of microwave electric field phase, comprises the following steps:

[0026] S11: setting the atom in the Rydberg state at a position that can sense the local microwave electric field and the microwave electric field of the signal to be measured;

[0027] S12: Using a detector to receive a detection signal of a set frequency band or ...

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Abstract

The invention provides a method for measuring the phase of a microwave electric field, which comprises the following steps of: setting atoms in a Rydberg state at positions capable of sensing a localmicrowave electric field and a signal microwave electric field to be measured, and receiving a detection signal of a set frequency band or frequency after the atoms are irradiated by probe light by using a detector, and further, determining the phase of the signal microwave electric field according to the detection signal. The measuring method is based on the quantum superheterodyne principle, wherein Rydberg atoms are used as microwave sensitive media, high-sensitivity measurement of the phase of the microwave electric field is achieved, the measuring sensitivity of the phase of the microwaveelectric field can be remarkably improved, and the measuring accuracy of the phase of the microwave electric field is improved. The method is clear in principle, simple in structure and easy to implement and apply, breaks through the existing indexes, and achieves the purpose of improving the microwave electric field measurement precision by one order of magnitude, thereby providing a new technical basis for the precision measurement research of the microwave electric field phase.

Description

technical field [0001] The invention relates to the field of microwave electric field phase measurement, and more specifically, to a method for measuring microwave electric field phase. Background technique [0002] Accurate measurement of microwave electric field phase plays an important role in astronomy, communication, radar and other fields, but the traditional measurement error of microwave electric field phase is relatively large, about ±5%. [0003] In recent years, with the development of quantum technology, the world has begun to use quantum technology to realize the research on microwave electric field phase measurement methods. Among them, the microwave electric field phase measurement scheme based on the quantum EIT-AT effect is limited by the width of the transparent window of the detection light. The width of the detection light window is affected by factors such as laser linewidth, photon shot noise, and decoherence of Rydberg atoms. It is difficult to achieve...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/12
CPCG01R29/12
Inventor 成永杰靳刚黄承祖刘星汛齐万泉
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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