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Method for identifying wheat scab extension resistance through wheat ear top double-flower inoculation

A technology for wheat head blight and wheat ear, which is applied in the field of identification and evaluation of plant disease resistance, can solve problems such as poor consistency of identification results, and achieve the effect of accurately expanding resistance and high success rate

Pending Publication Date: 2020-11-27
YANGZHOU UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to overcome the problems of withered and white spikes and the poor consistency of identification results that are prone to occur in the traditional single-flower instillation method, and to provide a kind of inoculated spikelet position with clear location, high inoculation success rate, obvious difference in resistance and susceptibility phenotype, and low incidence of disease. A method for identification of extended resistance to head blight with good consistency

Method used

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Embodiment Construction

[0016] The present invention will be further described below. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0017] The invention uses the scab-resistant strain R75 and the scab-susceptible strain S98 in the field to carry out dynamic identification of scab inoculation and extended resistance. On the 14th and 21st days after inoculation, the rate of diseased spikelets in the lower part of the inoculated spikelets was dynamically counted, so as to identify the extended resistance of the variety.

[0018] The steps of the method for identifying wheat scab extended resistance of the present invention are: utilize disc sampler on the solid plate culture medium of gibberella strain through activation, take 3-5 pieces of PDA solid medium with gibberella strain and put Put it into 60mL of sterilized mung bean soup medium, then place it on a shaker, and ...

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PUM

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Abstract

The invention discloses a method for identifying wheat scab extension resistance through wheat ear top double-flower inoculation. A prepared gibberella spore liquid is inoculated into bilateral florets of a sixth spikelet at the top of a wheat ear by utilizing a double-flower instilling method in a wheat flowering stage, a browning condition of inoculated spikelet is recorded, a diseased spikeletrate of infected spikelet at the lower part of the inoculated spikelet after inoculation is counted, and wheat scab extension resistance is dynamically evaluated. According to the inoculation method,a diseased part mainly expands downwards from the sixth spikelet on the top, the diseased spikelet rate at the lower part of the sixth spikelet is counted, diseased parts are consistent, the problem that identification reliability is affected due to the fact that white spikes are prone to being withered through a traditional single-flower instillation method is solved, and the extension resistanceof varieties can be reflected more accurately.

Description

technical field [0001] The invention relates to a method for identifying extended resistance to wheat scab by inoculating double flowers at the top of wheat ears, and belongs to the technical field of identification and evaluation of plant disease resistance. Background technique [0002] At present, the main method used in the identification of extended resistance to scab is the single flower drip method, that is, the single floret of the middle and lower spikelets of wheat ears is injected with spore liquid at the flowering stage of wheat, the inoculation time is recorded, and 18-18 days after inoculation. The rate of diseased spikelets was counted in 21 days, that is, the percentage of diseased spikelets to the total number of spikelets was evaluated for disease resistance. The traditional single-flower instillation method inoculates spikelets in the middle and lower parts of the spikelets, and the upper part of the spikelets is often damaged due to the destruction of vas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C12Q1/18G01N33/00G01N21/84A01G7/06A01G22/20
CPCC12Q1/18G01N33/0098G01N21/84A01G7/06A01G22/20G01N2021/8466G01N2333/37
Inventor 李韬朱素芹张语卉李磊孙政玺
Owner YANGZHOU UNIV
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