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Integrated circuit aging failure early warning method and circuit

An integrated circuit and circuit technology, applied in the field of integrated circuit aging failure early warning method and circuit field, can solve the problems of inconsistent aging degree, inability to carry effective early warning of circuit aging failure, and inaccurate measurement.

Inactive Publication Date: 2020-10-23
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the inconsistent aging degree of the detection path and the carrier circuit in actual work, only using the parameters of the detection path to measure the aging degree of the carrier circuit will lead to inaccurate measurement. In addition, the designed detection path can only measure the aging degree of the carrier circuit. It is impossible to provide effective early warning for the aging failure of the carrier circuit

Method used

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  • Integrated circuit aging failure early warning method and circuit
  • Integrated circuit aging failure early warning method and circuit
  • Integrated circuit aging failure early warning method and circuit

Examples

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Embodiment 1

[0048] See figure 1 , figure 1 It is a flow chart of an integrated circuit aging failure early warning method provided by an embodiment of the present invention. As shown in the figure, the integrated circuit aging failure early warning method of the embodiment of the present invention includes:

[0049] S1: Perform aging simulation on the carrier circuit and the early warning circuit, obtain the detection result of the early warning circuit when the carrier circuit fails, and take a value smaller than the detection result as the failure threshold;

[0050] S2: Place the carrier circuit and the early warning circuit in the same aging environment, perform regular detection according to a preset detection frequency, and obtain detection results of the early warning circuit;

[0051] S3: Comparing the detection result with the failure threshold, if the detection result is greater than or equal to the failure threshold, determining that the carrier circuit is about to age and fa...

Embodiment 2

[0062] See Figure 2-Figure 4 , figure 2 It is a structural block diagram of an integrated circuit aging failure warning circuit provided by an embodiment of the present invention; image 3 It is a structural schematic diagram of an integrated circuit aging failure warning circuit provided by an embodiment of the present invention; Figure 4 It is a schematic diagram of the circuit structure for obtaining detection results in the early warning circuit provided by the embodiment of the present invention. As shown in the figure, the integrated circuit aging failure warning circuit of the embodiment of the present invention includes:

[0063] Timing control module 1, used to generate a preset detection frequency signal;

[0064] The decoder 2 is connected to the timing control module 1, and the decoder 2 generates a control signal according to the preset detection frequency signal;

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Abstract

The invention relates to an integrated circuit aging failure early warning method and circuit. The integrated circuit aging failure early warning method comprises the steps of: carrying out aging simulation on a carrier circuit and an early warning circuit, acquiring a detection result of the early warning circuit when the carrier circuit fails, and taking a value smaller than a detection result as a failure threshold value; placing the carrier circuit and the early warning circuit in the same aging environment, and performing regular detection according to a preset detection frequency to obtain a detection result of the early warning circuit; comparing the detection result with the failure threshold value, if the detection result is greater than or equal to the failure threshold value, judging that the carrier circuit is about to age and fail, and generating an early warning signal, wherein the detection result is a frequency difference value between a first ring oscillator and a second ring oscillator in the early warning circuit, the first ring oscillator and the carrier circuit are kept in synchronous aging, and the second ring oscillator is kept not to be aged. According to the integrated circuit aging failure early warning method, effective early warning can be carried out on the aging failure condition of the carrier circuit.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit failure detection, and in particular relates to an integrated circuit aging failure early warning method and circuit. Background technique [0002] The sharp reduction of process size has greatly improved the performance of digital circuits, but at the same time, it has also brought more new challenges to the reliability of digital circuits. Under nanotechnology conditions, aging is one of the main problems affecting the reliability of digital circuits. Aging will cause the threshold voltage of transistors to increase, the inversion speed of logic gate units will slow down, and the circuit delay will increase, resulting in timing violations and eventually triggering Circuit failure. Therefore, the aging problem has received more and more attention, and the research on aging failure prediction has also increased. [0003] Aging failure prediction requires a continuous long-term testing...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/30
CPCG01R1/30G01R31/2856G01R31/2874G01R31/2879
Inventor 史江义韩玉秀张华春马佩军张馨元李林涛苏昭伟周艳
Owner XIDIAN UNIV
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