RTL-level circuit reliability measurement method based on random and parallel computing strategy
A measurement method and parallel computing technology, applied in the direction of calculation, calculation model, computer aided design, etc., can solve the problems of reducing the effectiveness and applicability of existing methods, and it is difficult to effectively balance the evaluation accuracy and calculation speed, so as to achieve reliable circuit sexual effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] The present invention will be further described below in conjunction with the accompanying drawings.
[0031] refer to figure 1 , a RTL-level circuit reliability measurement method based on a random and parallel computing strategy, comprising the following steps:
[0032] Step 1: Netlist analysis and initialization of related quantities, the process is as follows:
[0033] 1.1) Analyze the RTL-level circuit netlist through queue temporary storage technology and extract the original input terminal number npt of the circuit and the output terminal number mot of all modules;
[0034] 1.2) Initialize error tolerance err and basic sequence length ls, set ct={0}, cnt=0, t=1, mx=0 and mn=ls;
[0035] Step 2: Generate the circuit input vector vsq of length ls in parallel, the process is as follows:
[0036] 2.1) Generate the i-th uniform non-Bernoulli sequence pv of length ls in parallel based on the sobol sequence i ;
[0037] 2.2) Based on the parallel strategy from the ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com