A Quantitative Calculation Method for Secondary Oversizing of Silicate Based on Cathodoluminescence Technology
A quantitative calculation and cathodoluminescence technology, which is applied in calculation, measurement devices, image analysis, etc., can solve the problems of heavy workload and large deviation, and achieve the effect of improving identification accuracy and avoiding huge workload
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[0056] The implementation mode of the present invention is illustrated by specific specific examples below, and those who are familiar with this technology can easily understand other advantages and effects of the present invention from the contents disclosed in this description. Obviously, the described embodiments are a part of the present invention. , but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0057] like Figure 1-Figure 4 As shown, the present invention provides a quantitative calculation method for silicon secondary enlargement based on cathodoluminescence technology, including:
[0058] S100, irradiating the target sandstone with cathode rays to obtain a cathodoluminescence image with cementation features preserved;
[0059] S200. Process the obtained cathodoluminescence image wi...
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