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Spherical curved crystal spectrometer for electron beam ion trap

A technology of ion traps and electron beams, applied in instruments, scientific instruments, electrical excitation analysis, etc., can solve the problems of poor spatial resolution, no focusing function, no focusing function, etc., and achieve the effect of large luminous flux

Active Publication Date: 2020-08-04
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For crystals, it can be divided into planar crystals, cylindrical crystals and spherical crystals: planar crystals are like ordinary gratings, which only perform dispersion in the wavelength direction and have no focusing function. Additional lens groups are required for focusing, which will bring complexity; Planar crystals can simultaneously disperse and focus in the wavelength direction, and the intensity of the diffraction line is sufficient without additional lens groups. However, in the spatial direction, there is no focusing function, so the spatial resolution is poor; in the past, the general EBIT device has Using a planar crystal spectrometer to measure the spectrum of the X-ray band, which is characterized by a wide wavelength coverage, but poor focusing ability

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  • Spherical curved crystal spectrometer for electron beam ion trap
  • Spherical curved crystal spectrometer for electron beam ion trap
  • Spherical curved crystal spectrometer for electron beam ion trap

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Embodiment Construction

[0015] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0016] Attached below Figure 1-2 , to further illustrate a spherical curved crystal spectrometer used in an electron beam ion trap provided by the present invention.

[0017] See attached figure 1 A spherical curved crystal spectrometer for electron beam ion traps provided by the present invention mainly includes a detector 1, a crystal system 2, a control display system 3, a vacuum unit 4, a water cooling system 5, and an electron beam ion trap ...

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Abstract

The invention discloses a spherical curved crystal spectrometer for an electron beam ion trap. The spherical curved crystal spectrometer comprises a detector, a crystal system, a control display system, a vacuumizing unit, a water cooling system, a valve and an electron beam ion trap EBIT. The detector is connected to the crystal system, the control display system, the vacuumizing unit and the water cooling system, and the crystal system is connected to the electron beam ion trap EBIT through the valve; the crystal system comprises three SiO2 spherical crystals and a crystal turntable; each spherical crystal is placed on a circumference of the crystal turntable at an interval of 120 degrees; the crystal turntable can rotate by 360 degrees; different crystals are selected and diffraction angles of the crystals are changed; and a horizontal moving guide rail is arranged below the crystal turntable and used for moving the turntable and changing a horizontal distance between the sphericalcrystal and an electron beam ion trap EBIT light source, the different crystals are selected by rotating the crystal turntable to carry out light wave diffraction of corresponding wavelengths, and meanwhile, the detector can be moved to the corresponding position, and an optimal spectrum collecting effect is achieved.

Description

technical field [0001] The invention relates to the field of spectroscopic observation equipment, in particular to a spherical curved crystal spectrometer used on an electron beam ion trap. Background technique [0002] The Electron Beam Ion Trap (EBIT) is a unique instrument that enables experiments with highly charged ions by varying the electron beam energy. As a high-charge state ion observation device, EBIT has many advantages. First, it can establish a narrower charge balance, and most ions are in the same ionization state; second, in a good ultra-high vacuum environment, its ion trap There is only one main element in the region; more importantly, the electron energy distribution is very narrow, which allows us to fine-tune the energy for excitation of fine energy levels, while in a hot plasma, because a large number of processes occur simultaneously, it is not conducive to the study of a single Effect; finally, the ion temperature in EBIT is lower, which means that D...

Claims

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Application Information

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IPC IPC(8): G01N21/68G01N21/01
CPCG01N21/68G01N21/01Y02E30/10
Inventor 吕波宾斌张洪明符佳王福地
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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