Method for preparing silicon carbide epitaxy substrate at low temperature
A silicon carbide and silicon carbide layer technology, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as hindering the development and application of silicon carbide epitaxial substrates, affecting later use, and large internal stress inside the substrate
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Embodiment 1
[0045] S1. A silicon carbide single crystal structure is selected as a substrate, and the thickness of the substrate is 160 μm.
[0046] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 40 μm; the roughness value of the polished single crystal surface is Ra0.04.
[0047] S3. Heating the whole structure, the heating temperature is controlled at 800° C., the pressure inside the heating reactor is set at 150 mbar, and the heating time is 3 minutes.
[0048] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.
[0049] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 400 μm.
Embodiment 2
[0053] S1. A silicon carbide single crystal structure is selected as the substrate, and the thickness of the substrate is 170 μm.
[0054] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 50 μm; the roughness value of the polished single crystal surface is Ra0.03.
[0055] S3. Heating the whole structure, the heating temperature is controlled at 1000° C., the pressure inside the heating reactor is set at 80 mbar, and the heating time is 2 min.
[0056] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.
[0057] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 300 μm.
[0058] S6, performing laser pulse impact on the u...
Embodiment 3
[0061] S1. A silicon carbide single crystal structure is selected as a substrate, and the thickness of the substrate is 180 μm.
[0062] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 30 μm; the roughness value of the polished single crystal surface is Ra0.02.
[0063] S3. Heating the whole structure, the heating temperature is controlled at 900° C., the pressure inside the heating reactor is set at 120 mbar, and the heating time is 3 minutes.
[0064] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.
[0065] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 300 μm.
[0066] S6, performing laser pulse impact on the...
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