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Ion probe laboratory monitoring system and method

An ion probe and monitoring system technology, applied in the field of ion probe laboratory monitoring system, can solve the problems of instrument testing machine tension, high price, large application volume, etc., to reduce loss, improve use efficiency, and improve uptime Effect

Inactive Publication Date: 2020-07-10
GUANGZHOU INST OF GEOCHEMISTRY - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the price of large-scale secondary ion mass spectrometers is high (about 40 million RMB). At present, the number of large-scale secondary ion mass spectrometers in China is very small, but the application volume is large and the demand is strong, so the instrument testing machine is very tight.

Method used

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  • Ion probe laboratory monitoring system and method
  • Ion probe laboratory monitoring system and method

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Embodiment 1

[0028] according to figure 1 As shown, this embodiment proposes an ion probe laboratory monitoring system, including a temperature and humidity monitoring unit 4, a cooling system monitoring unit 5, an ion current intensity monitoring unit 6, and a specific analysis result monitoring unit 7, and a temperature and humidity monitoring unit 4 Control the temperature and humidity probe 8 around the secondary ion mass spectrometer 2, the cooling system monitoring unit 5 controls the cooling water flow rate meter 9 on the cooling water circuit of the secondary ion mass spectrometer 2, and the ion current intensity monitoring unit 6 controls the secondary ion mass spectrometer 2 The primary ion source intensity acquisition device 10 at the primary ion source, and the specific analysis result monitoring unit 7 controls the ion receiver 11 of the receiver part of the secondary ion mass spectrometer 2 . The receiver part includes a single receiver part and multiple receivers.

[0029] ...

Embodiment 2

[0035] according to figure 2 As shown, the present embodiment proposes an ion probe laboratory monitoring method for the ion probe laboratory monitoring system of Embodiment 1, specifically as follows:

[0036] The instrument status monitoring software 3 integrates the data obtained by the temperature and humidity monitoring unit 4, the cooling system monitoring unit 5, the ion current intensity monitoring unit 6 and the specific analysis result monitoring unit 7 into a monitoring interface;

[0037] The temperature and humidity monitoring unit 4 obtains the temperature and humidity signal of the surrounding environment of the secondary ion mass spectrometer 2 through the temperature and humidity probe 8, and the temperature and humidity signal read is transmitted back to the temperature and humidity monitoring unit 4 in the computer 1 through the wireless receiving module. The threshold is set in the software 3. When the fluctuation of temperature and humidity exceeds the th...

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Abstract

The invention discloses an ion probe laboratory monitoring system and method. The invention relates to the technical field of laboratory instrument state and experiment environment detection. The system comprises a temperature and humidity monitoring unit, a cooling system monitoring unit, an ion flow intensity monitoring unit and a specific analysis result monitoring unit, the temperature and humidity monitoring unit controls temperature and humidity probes around the secondary ion mass spectrometer; the cooling system monitoring unit controls a cooling water flow rate meter on a cooling water path of the secondary ion mass spectrometer, the ion flow intensity monitoring unit controls a primary ion source intensity acquisition device at a primary ion source of the secondary ion mass spectrometer, and the specific analysis result monitoring unit controls an ion receiver of a receiver part of the secondary ion mass spectrometer. The ion probe laboratory monitoring system has the beneficial effects that the engineer can accurately obtain the real-time condition of the laboratory by deploying and controlling the monitoring system in the ion probe laboratory, the loss of the instrumentwhen the instrument is not analyzed is reduced, and the use efficiency of the instrument is improved.

Description

technical field [0001] The invention relates to the technical field of laboratory instrument status and experimental environment detection, in particular to an ion probe laboratory monitoring system and method. Background technique [0002] Secondary ion mass spectrometry is an advanced method for micro-area in-situ analysis. It has the advantages of high sensitivity, high spatial resolution and high precision. In recent years, it has developed rapidly in geoscience-related fields and has an irreplaceable role in geosciences. application value. However, the price of large-scale secondary ion mass spectrometers is high (about 40 million RMB). At present, the number of large-scale secondary ion mass spectrometers in China is very small, but the application volume is large and the demand is strong, so the instrument testing machine is very tight. [0003] Therefore, it is an urgent need for all laboratories of the same type in the world to reduce the loss of the instrument whe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/02H01J49/26H01J49/00G01D21/02G01N27/62
CPCH01J49/025H01J49/02H01J49/26H01J49/0031H01J49/0036G01N27/62G01D21/02
Inventor 杨晴夏小平张万峰张彦强杨亚楠何妙
Owner GUANGZHOU INST OF GEOCHEMISTRY - CHINESE ACAD OF SCI
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