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Device and method for testing interrupt program in data acquisition mode

A technology of data acquisition and acquisition device, which is applied in the field of devices for testing interrupt programs through data acquisition, can solve problems such as easy occurrence of bugs, easy occurrence, and scrambled memory data, so as to reduce test time, increase execution probability, and improve The effect of testing efficiency

Pending Publication Date: 2020-06-23
许华敏
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Soft interrupts and hard interrupts can be executed in any part of the normal program operation, so that after the soft interrupt program and hard interrupt program run, the memory data that may be running may be disrupted, which is prone to bugs
At the same time, due to its randomness, it can be executed in any logical segment. If the hard interrupt program needs to close a certain output point, and after execution, a statement behind it is to open the output point, which means that the interrupt program is not executed. prone to major hazards
[0003] Due to the randomness of the interrupt program, even if the program is continuously triggered and executed during the test, the tester does not know whether the executed random program has been verified or how many times it has been verified in those parts of the program. The results are difficult to quantify
At the same time, due to the fast running speed of the program, if the output error is only a few seconds or a few milliseconds, but the important ignition command may have been issued, it is difficult for the tester to find that the program is executed abnormally, but it will cause very serious consequences and losses.

Method used

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  • Device and method for testing interrupt program in data acquisition mode
  • Device and method for testing interrupt program in data acquisition mode
  • Device and method for testing interrupt program in data acquisition mode

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Embodiment Construction

[0016] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0017] Such as figure 1 As shown, the device for testing the interrupt program by means of data acquisition of the present invention includes a device under test and a test data acquisition device, and the test data acquisition device collects trigger signals and output point signals of the device under test, and the device under test includes the software under test. The main program and / or subroutine of the software under test increases the entry and exit flag bit. The specific increase method is to set the entry flag bit when entering the subroutine, and clear the entry flag bit when exiting the subroutine. The execution logic identification module and the output trigger signal are added to the interrupt program. The specific process of executing the logic identification identification module is: read the entry flag bit of each subroutine i...

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PUM

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Abstract

The invention relates to the technical field of software testing, in particular to a device and method for testing an interrupt program in a data acquisition mode. According to the invention, the number of times that the interrupt program is executed in the normal execution program according to a certain logic is identified, the trigger signal is added in the interrupt program, and the test data acquisition device acquires the output point signal, so that a tester can discover the defects of the program in time.

Description

technical field [0001] The invention relates to the technical field of software testing, in particular to a device and method for testing interrupt programs through data collection. Background technique [0002] Interrupt programs can be divided into soft interrupts and hard interrupts. Soft interrupts are randomly generated by the software program during the running of the software. For example, the timer reaches a certain data, the communication transmission and reception is interrupted, and the high-speed counter reaches a certain value. The hard interrupt is caused by external input data, such as The falling edge of an external acquisition signal causes an interrupt trigger, and when the signal changes from 1 to 0, it will cause the trigger of the interrupt program. Soft interrupts and hard interrupts can be executed in any part of the normal program operation, so that after the soft interrupt program and hard interrupt program run, the memory data that may be running ma...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F11/30
CPCG06F11/3688G06F11/302Y02D10/00
Inventor 殷律胡慧文邬瑾扬沈小川李华吉波
Owner 许华敏
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