Test data generation method and device, storage medium and intelligent equipment
A technology for testing data and parameters, applied in electrical digital data processing, software testing/debugging, error detection/correction, etc. It can solve the problems of time-consuming and labor-intensive manual design of test data, low efficiency of test data generation, and low test efficiency, etc. problems, to improve generation efficiency, speed up testing progress, and save manpower and time
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[0045] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0046] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.
[0047] It should...
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