A high-precision test method for microwave dielectric properties of high-loss materials

Abstract

The invention discloses a method for measuring the microwave dielectric properties of high-loss materials by adopting an electric field symmetry structure. On the basis of the traditional resonance method, a perturbation method with an electric field symmetry structure is adopted, which mainly consists of the following structures: TE 011 Mode metal resonant cavity, high-Q circular TE 011 A mode dielectric resonator, a coupling adjustment device and a circular rod-shaped sample to be tested. by TE 011 Mode ring resonators and metal resonators can limit the test frequency to a specific frequency range. During the test, put the round rod-shaped sample to be tested into the circular TE 011 In the mode dielectric resonator, the measured sample can be better positioned at the axial center of the metal resonant cavity, reducing the error caused by the position offset, ensuring that the electric field structure is a symmetrical structure, and improving the interface between two materials with different electrical properties The uniformity of electric field distribution can effectively improve the test accuracy of dielectric properties.

Description

Technical field[0001]The present invention belongs to the technical field of microwave dielectric performance, including, but not limited to, high dielectric loss materials and testing of microwave dielectric properties under temperature change conditions.Background technique[0002]With the development of microwave technology, the use of high-grade electricity loss materials represented by the absorbing material is increasingly widely used in the field of aerospace, electromagnetic pollution, and the precise dielectric performance is required in many practical applications, but The precise test of high dielectric losses in microwave band dielectric performance has always been a problem.[0003]The test method of the microwave dielectric performance of the high dielectric loss material is mainly based on transmission / reflection method, and the representative method has free space method, waveguide method, coaxial air line method, etc., these methods are tested during the test. Sensiti...

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Problems solved by technology

The problem with this structure is that it is impossible to ensure that the ceramic reference sample and the sample to be tested are in the geometric center of the cavity during the actual measurement process. The resulting problem is that the structure only has symmetry in the vertical direction, but in the direction of the feeding axis. It does not have complete symmetry, so the electric field distribution at the interface between two different electrical performance materials will be uneven, which will affect the electromagnetic field distribution in the resonant cavity, bring errors to the measurement of resonant frequency and quality factor, and cannot realize high-loss dielectric material microwave Accurate measurement of dielectric properties

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