Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Memory exception processing method and system, electronic equipment and storage medium

A processing method and memory technology, applied in the computer field, can solve problems such as signal interference errors, system performance degradation, downtime, etc., and achieve the effect of reducing memory read and write errors and lowering the error rate

Inactive Publication Date: 2020-05-12
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF5 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the development of computer technology, the requirements for the stability and reliability of the server are getting higher and higher, and the operating frequency of the memory is also getting faster and faster. The higher the frequency, the signal is more likely to be interfered with and make mistakes, which will cause the server memory to report an error and reduce reliability.
Memory errors can be simply divided into two types: CE (Correct Error, correctable error) and UCE (Uncorrect Error, uncorrectable error). UCE causes software to read and write data errors, and CE error can be corrected by algorithm calculation, but it will lead to system performance degradation. And the continuous CE will become UCE, which will lead to errors in software reading and writing data, or even downtime

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory exception processing method and system, electronic equipment and storage medium
  • Memory exception processing method and system, electronic equipment and storage medium
  • Memory exception processing method and system, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0035] see below figure 1 , figure 1 It is a flow chart of a memory exception processing method provided by the embodiment of the present application.

[0036] Specific steps can include:

[0037] S101: Read the memory error number of the target memory bar in the memory Error register;

[0038] Wherein, the memory error register (that is, the memo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a memory exception processing method. The processing method comprises the steps of reading a memory error number of a target memory bank in a memory Error register; when the memory error number is greater than a preset value, executing a heat removal operation on the target memory bank; calculating a memory delay parameter, and writing the memory delay parameter into a memory controller; wherein the memory delay parameter is waiting time after the memory controller controls the target memory bank to receive a read-write command; and executing a hot addition operation onthe target memory bank, so that the memory controller continues to execute a read-write operation on the target memory bank by using the memory delay parameter. According to the invention, the errorrate of memory reading and writing can be reduced. The invention furthermore discloses a memory exception processing system, electronic equipment and a storage medium, which have the above beneficialeffects.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular to a processing method and system for abnormal memory, an electronic device and a storage medium. Background technique [0002] With the development of computer technology, the requirements for the stability and reliability of the server are getting higher and higher, and the operating frequency of the memory is also getting faster and faster. The higher the frequency, the signal is more likely to be interfered with and make mistakes, which will cause the server memory to report an error and reduce reliability. . Memory errors can be simply divided into two types: CE (Correct Error, correctable error) and UCE (Uncorrect Error, uncorrectable error). UCE causes software to read and write data errors, and CE error can be corrected by algorithm calculation, but it will lead to system performance degradation. And the continuous CE will become UCE, which will lead to erro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07
CPCG06F11/073G06F11/079G06F11/0793G06F11/1666G06F2201/81G11C29/023G11C29/028G11C2029/0411G06F3/0619G06F3/0629G06F3/0659G06F3/0673
Inventor 李双庆
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products