Background calibration method for capacitance mismatch and interstage gain error of pipelined SAR ADC (Synthetic Aperture Radar Analog-to-Digital Converter)

A gain error, calibration method technology, applied in electrical components, electrical signal transmission systems, signal transmission systems, etc., can solve the problem of increasing the circuit complexity of analog circuits, increasing digital logic delay, increasing system area power consumption and circuit complexity and other problems to achieve the effect of improving the signal-to-noise ratio and spurious-free dynamic range

Active Publication Date: 2020-04-07
SOUTHEAST UNIV
View PDF2 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But in this paper, the additional time-domain proximity detector will add additional analog circuits and circuit complexity. At the same time, the injection of PN will consume the inter-stage redundancy of the pipelined SAR ADC, which may saturate the second-stage SAR ADC.
[0004] At the 2017 IEEE ISSCC meeting, the literature [C.Liu and M.Huang.:'A 0.46mW 5MHz-BW79.7dB-SNDR noise shaping SAR ADC with dynamic-amplifier-based FIR-IIRfilter', International Solid-State Circuits Conference , San Francisco, CA, 2017, pp.466-467] Using data weighted average technology to disperse the harmonics caused by capacitor mismatch, but data weighted average technology requires a capacitor array with temperature code encoding and a binary to temperature code circuit, which is undoubtedly Increase the area power consumption and circuit complexity of the system, and also increase the delay of digital logic
However, the gain error shaping technology requires an additional digital-to-analog converter, and the gain error shaping technology can only suppress the gain error, and has no shaping effect on the capacitance mismatch

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Background calibration method for capacitance mismatch and interstage gain error of pipelined SAR ADC (Synthetic Aperture Radar Analog-to-Digital Converter)
  • Background calibration method for capacitance mismatch and interstage gain error of pipelined SAR ADC (Synthetic Aperture Radar Analog-to-Digital Converter)
  • Background calibration method for capacitance mismatch and interstage gain error of pipelined SAR ADC (Synthetic Aperture Radar Analog-to-Digital Converter)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0031] The invention proposes a background calibration method for correcting capacitance mismatch and inter-stage gain error in pipelined SAR ADC. figure 1 Shown is the block diagram and timing diagram of a pipelined SAR ADC equipped with noise quantizer technology; figure 1 (a) is a structural block diagram of traditional pipelined SAR ADC combined with noise quantizer technology, figure 1 (b) in (b) is the timing diagram of the proposed pipelined SAR ADC. Improvements are made on the basis of the standard 10bit pipelined SAR ADC structure. The block diagram is mainly composed of a 4bit SAR ADC, a margin amplifier and a 7bit SAR ADC stage, including 1bit interstage redundancy to cover the front stage SAR ADC. Judgment error. The first-stage SAR ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a background calibration method for correcting capacitance mismatch and an interstage gain error in a pipelined SAR ADC (Synthetic Aperture Radar Analog-to-Digital Converter),which comprises the following steps of: injecting a pseudo random sequence PN (Pseudo-Noise) signal into a background, extracting the gain error of the capacitance mismatch and the interstage operational amplifier, and then correcting the gain error by a digital calibration engine. Meanwhile, the invention further provides a noise quantizer technology. During the first-stage SAR conversion, the inter-stage operational amplifier is multiplexed into an additional comparator, the two comparators compare the same input signal, and the comparison result is used for detecting whether the margin voltage is near the threshold of the comparator or not, thereby deciding whether to inject a pseudo random sequence PN signal or not. According to the method, capacitor mismatch and gain errors in the pipelined SAR ADC can be corrected without an additional analog circuit and time sequence overhead, harmonic components in a signal band can be effectively reduced, the signal-to-noise ratio is obviouslyimproved, and the spurious-free dynamic range is obviously enlarged.

Description

technical field [0001] The invention relates to the technical field of high-precision analog-to-digital converters, in particular to a background calibration method for correcting capacitance mismatch and inter-stage gain errors in a pipelined SARADC. Background technique [0002] Pipelined Successive Approximation Register Digital to Analog Converter (Pipelined Successive Approximation Register Digital to Analog Converter, hereinafter referred to as pipelined SAR ADC) is actually an effective combination of pipelined ADC and SAR ADC. mechanism combined to achieve high energy efficiency and high-speed performance at the same time. However, the resolution of pipelined SAR ADCs is limited by capacitance mismatch and inter-stage gain errors. To improve resolution, jitter-based calibration is widely used in various ADCs to correct capacitance mismatch or gain error, but it requires additional hardware overhead or complex switching operations. Data-weighted averaging techniques...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H03M1/38
CPCH03M1/38
Inventor 吴建辉张力振李红
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products