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Method for testing storage performance of NVRAM

A technology of storage performance and storage space, applied in the field of electronics, can solve the problems of failure of storage unit storage function, unrecognized failure of storage function, failure of effective detection of lost data function, and impact on normal training of troops, and achieves comprehensive testing, high cost, and accuracy. high effect

Inactive Publication Date: 2020-02-28
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the existing test method cannot identify the storage function failure of some NVRAM storage units, it also cannot effectively detect the data loss function after the device is powered off due to the failure of the built-in battery, which leads to misjudgment of the device detection and affects the troops. For the technical problem of normal training, the present invention proposes a comprehensive testing method for the storage performance of NVRAM (Non-Volatile Random Access Memory), which solves the above technical problem, can realize fast, accurate and comprehensive fault diagnosis, and effectively improve Improve the reliability, accuracy and comprehensiveness of NVRAM storage performance testing

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  • Method for testing storage performance of NVRAM

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Embodiment Construction

[0028] The present invention will be further described in conjunction with accompanying drawing of specification sheet and concrete implementation now:

[0029] A method for testing the performance of NVRAM storage, including a built hardware circuit and a written test program. The hardware resources required by the test method are self-made test devices and the NVRAM of the tested object, and the required software is a self-written test program solidified in the memory of the self-test device.

[0030] The self-made test device includes computing module, storage module, controller module, underlying driver module, application program module, self-diagnosis module and test interface, see figure 1 .

[0031] The calculation module is the processing unit of the test device, which mainly carries out calculation processing on various data and executes various instructions;

[0032] The controller module is the key control part of the coordinated work among the modules. According...

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Abstract

The invention belongs to the technical field of electronics. The invention relates to a method for comprehensively testing the storage performance of an NVRAM (Non-Volatile Random Access Memory). By adopting the technical scheme of specific constant value detection, variable value detection and offline and environment simulation detection, rapid, accurate and comprehensive fault diagnosis can be realized, and the reliability, accuracy and comprehensiveness of NVRAM storage performance testing are effectively improved. Hardware resources required by the test method are a self-made test device and a tested object NVRAM, and required software is a self-written test program solidified in a memory of the self-test device. After the testing device is powered on and started, the performance of the testing device can be diagnosed, after it is confirmed that the performance of the testing device is normal, on-line constant value, on-line variable value and off-network storage performance testing operation is conducted on the Nvram, and a testing result is fed back. The problems of incompleteness and incapability of detecting boundaries of the conventional test are solved, and the complete test of NVRAM full-storage space and online and offline synchronous detection is realized. The testing method has the advantages of being low in cost, high in reliability and easy to implement.

Description

technical field [0001] The invention belongs to the field of electronic technology and relates to a comprehensive testing method for storage performance of NVRAM (non-volatile random access memory). Background technique [0002] NVRAM (Non-Volatile Random Access Memory) refers to those semiconductor memories that retain data even when power is turned off. NVRAM is one of the most important storage devices at present and even in the future because the current and future non-volatile memories have good or even very good random addressing capabilities. With the rapid development of mobile devices, portable devices and wireless devices , NVRAM also encountered an unprecedented good time and developed rapidly. NVRAM has the physical advantages of DRAM and SRAM, fast transmission speed, large single-chip capacity, and long-term storage characteristics of hard disks, so it is widely used in automotive systems, communication systems, computer systems, industrial systems, etc. [0...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 朱姝
Owner LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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