Satellite discharge depth over-limit diagnosis and recovery test method
A technology for depth of discharge and recovery testing, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problem of inability to diagnose and verify the recovery strategy of battery pack depth of discharge exceeding the limit, random occurrence or non-occurrence, and inability to achieve multi-layered Problems such as fault diagnosis and comprehensive verification of recovery strategies can reduce performance degradation and use risks, increase service life, and improve efficiency and automation.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0021] According to the present invention, during the current satellite ground test process, satellite faults occur randomly or do not occur, and cannot verify the over-limit diagnosis and recovery strategy of the battery pack discharge depth, and cannot realize the multi-layer fault diagnosis and recovery strategy with other subsystems. Comprehensive verification, proposes a method that can cause faults to occur at a specific time and in a specific environment according to needs, and realizes a comprehensive verification of the satellite discharge depth over-limit diagnosis and recovery strategy.
[0022] The present invention will be explained and described in detail below in conjunction with the drawings, such as figure 1 Shown is a flow chart of a method for diagnosing and recovering satellite discharge depth exceeding limit according to the present invention, figure 2 Shown is the connection block diagram of the satellite discharge depth over-limit diagnosis and recovery tes...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com