Intelligent defect identification scanner and using method thereof
A technology of defect identification and scanner, which is applied in the direction of optical testing defect/defect, instrument, scientific instrument, etc. It can solve the problems of low efficiency and high production cost, and achieve the effect of reducing labor cost, convenient single-person operation and high detection efficiency
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[0029] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.
[0030] Such as Figure 1-4 As shown, a defect scanner of the embodiment includes a detection platform 1, a conveying device 2, a light source 3 and a plurality of detection devices 4;
[0031] The conveying device 2 is arranged on the detection platform 1, and the conveying device 2 is used to convey the raw material to the bottom of the detection device 4 along the detection platform 1;
[0032] The detection platform 1 is provided with a mounting bracket 11, a plurality of the detection devices 4 are arranged linearly on the mounting bracket 11, the detection end of the detection device 4 is vertically set downward, and the light source 3 is set On the mounting bracket 11, the detection device 4 is an industrial camera;
[0033] It also includes an information processing device, the signal acqui...
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