Label defect detection algorithm based on twin network
A twin network and defect detection technology, which is applied to biological neural network models, optical testing flaws/defects, calculations, etc., can solve problems such as high network requirements, only supports offline detection, and template matching cannot cope with rotation and scaling, etc. Range of application, effect with high degree of freedom of choice
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[0059] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described below in conjunction with specific examples and with reference to the accompanying drawings. It should be pointed out that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0060] The present invention is based on the label defect detection algorithm of the twin network. By establishing the twin network, the training set is put into the network for training, the loss function, similarity, etc. are calculated, and the two classifications are used to distinguish good and bad labels. The classification accuracy rate of the verification set is an average accuracy rate of 100 outputs. When the classification accuracy rate on the verification set is also stable and exceeds 99%, the t...
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