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Atomic energy spectrum measurement system and measurement method

A technology of atomic energy spectrum and measurement system, which is applied in the direction of X-ray energy spectrum distribution measurement, etc., can solve problems affecting the measurement accuracy of atomic oxygen energy spectrum, and achieve the effect of improving measurement accuracy

Inactive Publication Date: 2019-08-23
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

[0005] Since the plasma space potential and the sheath voltage generally reach several V, or even more than ten V, the ionized thermally moving ions such as the background gas ions will be accelerated by the space potential and the sheath and will also enter the tube lens energy analyzer. , affecting the measurement accuracy of the atomic oxygen spectrum

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  • Atomic energy spectrum measurement system and measurement method
  • Atomic energy spectrum measurement system and measurement method
  • Atomic energy spectrum measurement system and measurement method

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Embodiment Construction

[0043] The above is the core idea of ​​the present invention. In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention Description, obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0044] The embodiment of the present invention provides an atomic energy spectrum measurement system, which is mainly used for the measurement of the atomic energy spectrum distributed in the range of several eV to more than ten eV suc...

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Abstract

The invention provides an atomic energy spectrum measurement system and measurement method. The measurement system comprises a plasma generator, a collimation unit, an electronic gun, a collection unit and a measurement unit, wherein the plasma generator is used for generating plasmas, and the plasmas pass through a neutralized board to generate an atomic beam; the collimation unit is used for collimating the atomic beam; the electronic gun is used for emitting an electronic beam of nanosecond pulse width to enable the electronic beam to bombard the collimated atomic beam, and the atomic beamis ionized into ions; the collection unit is used for collecting the ions; and the measurement unit is used for carrying out measurement to obtain the current-time signal of the collection unit, and obtaining the energy spectrum information of the atomic beam according to the current-time signal. In the measurement system, the electronic beam of the nanosecond pulse width is used as an ionizationsource. Since electron and ion generation time is short, the plasmas can not be formed on the receiving port of the collection unit in time, so that the space potential and the sheath of the plasma can not be generated, and therefore, atomic energy spectrum measurement accuracy is improved.

Description

technical field [0001] The invention relates to the technical field of energy spectrum measurement, and more specifically, relates to an atomic energy spectrum measurement system and a measurement method. Background technique [0002] Atomic oxygen is one of the most important environmental factors in Low Earth Orbit (LEO). It will cause very fatal damage to exposed components and materials of spacecraft, and affect its service life in orbit. In order to ensure the long-term reliable operation of spacecraft in orbit, many international research institutions and international organizations have carried out related research work by establishing simulation devices on the ground. Among them, the accurate measurement of atomic oxygen spectrum parameters is the basis of the above research work. [0003] Such as figure 1 As shown, the prior art discloses a method for measuring the atomic energy spectrum, which is used for measuring the energy spectrum of the atomic oxygen beam ge...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 程健王梦永翟红雨
Owner UNIV OF SCI & TECH OF CHINA
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